相关论文: Neutron induced strike: On the likelihood of multi…

Soft errors have a significant impact on the circuit reliability at nanoscale technologies. At the architectural level, soft errors are commonly modeled by a probabilistic bit-flip model. In developing such abstract fault models, an…

A single event upset (SEU) is a critical soft error that occurs in semiconductor devices on exposure to ionising particles from space environments. SEUs cause bit flips in the memory component of semiconductors. This creates a multitude of…

In contemporary times, the increasing complexity of the system poses significant challenges to the reliability, trustworthiness, and security of the SACRES. Key issues include the susceptibility to phenomena such as instantaneous voltage…

The advanced complex electronic systems increasingly demand safer and more secure hardware parts. Correspondingly, fault injection became a major verification milestone for both safety- and security-critical applications. However, fault…

Designing integrated circuits in radiation environments such as the High Luminosity LHC (HL-LHC) is challenging. Integrated circuits will be exposed to radiation-induced Single Event Effects (SEE). In deep sub-micron technology devices, the…

Rapidly shrinking technology node and voltage scaling increase the susceptibility of Soft Errors in digital circuits. Soft Errors are radiation-induced effects while the radiation particles such as Alpha, Neutrons or Heavy Ions, interact…

Soft errors are a type of transient digital signal corruption that occurs in digital hardware components such as the internal flip-flops of CPU pipelines, the register file, memory cells, and even internal communication buses. Soft errors…

Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual…

Single Event Effects (SEEs) - predominately bit-flips in electronics caused by particle interactions - are a major concern for ASICs operated in high radiation environments such as ABCStar ASICs, which are designed to be used in the future…

This paper presents a detailed evaluation of the efficiency of software-only techniques to mitigate SEU and SET in microprocessors. A set of well-known rules is presented and implemented automatically to transform an unprotected program…

Alpha-particles and cosmic rays cause bit flips in chips. Protection circuits ease the problem, but cost chip area and power, and so designers try hard to optimize them. This leads to bugs: an undetected fault can bring miscalculations, the…

Reliability has been a major concern in embedded systems. Higher transistor density and lower voltage supply increase the vulnerability of embedded systems to soft errors. A Single Event Upset (SEU), which is also called a soft error, can…

Stability of ultra-low-voltage SRAM bitcells in retention mode is threatened by two types of uncertainty: process variability and intrinsic noise. While variability dominates the failure probability, noise-induced bit flips in weakened…

Whereas contemporary Error Correcting Codes (ECC) designs occupy a significant fraction of total die area in chip-multiprocessors (CMPs), approaches to deal with the vulnerability increase of CMP architecture against Single Event Upsets…

A new physics-based model for analytical calculation of Soft Error Rate (SER) in digital memory circuits under the influence of heavy ions in space orbits is proposed. This method is based on parameters that are uniquely determined from the…

With technology scaling, lower supply voltages, and higher operating frequencies clock distribution networks become more and more vulnerable to transients faults. These faults can cause circuit-wide effects and thus, significantly…

We consider the error due to a single bit-flip in a floating point number. We assume IEEE 754 double precision arithmetic, which encodes binary floating point numbers in a 64-bit word. We assume that the bit-flip happens randomly so it has…

Intellectual Property (IP) theft is a serious concern for the integrated circuit (IC) industry. To address this concern, logic locking countermeasure transforms a logic circuit to a different one to obfuscate its inner details. The…

The writing process of SOT-MRAMs is considered deterministic when additional symmetry-breaking factors, such as the application of an external magnetic field aligned with the current, are present. Notably, the write probability exhibits a…

Neural Networks (NNs) are increasingly used in the last decade in several demanding applications, such as object detection and classification, autonomous driving, etc. Among different computing platforms for implementing NNs, FPGAs have…