相关论文: Quantitative Measurements of Electromechanical Res…
Optically pumped magnetometers (OPMs) have emerged as a powerful technique for high-resolution magnetic field imaging. However, achieving sub-millimeter spatial resolution at sub-picotesla sensitivities ($\mathrm{< 1\,pT/\sqrt{Hz}}$)…
We propose a scheme to measure the quantum state of a nanomechanical oscillator cooled near its ground state of vibrational motion. This is an extension of the nonlinear atomic homodyning technique scheme first developed to measure the…
Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which…
The displacement of micro-electro-mechanical-systems (MEMS) cantilevers is used to measure a broad variety of phenomena in devices ranging from force microscopes to biochemical sensors to thermal imaging systems. We demonstrate the first…
The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work function and tip-sample forces.…
Properties of typical MEMS materials have been widely investigated. Mechanical properties of MEMS structures depend not only on the bulk material properties, but also structural factors. A measurement system has been made to measure…
Atomic Force Microscopy (AFM) combined with electrical modes provides a powerful contactless approach to characterize material electrical properties at the nanoscale. However, conventional electrostatic models often overlook dynamic charge…
Recently, using an Atomic Force Microscope and a single cantilever excited at different frequencies it was shown that water nanomeniscus can exhibit a transition in mechanical responses when submitted to stimuli above few tens of kHz. The…
We describe a method for feedback-regulation of a microcantilever's response using optical radiation pressure. One laser measures the position of the cantilever and another laser applies a force that is a phase-shifted function of that…
In multifrequency atomic force microscopy higher eigenmodes are externally excited to enhance resolution and contrast while simultaneously increasing the number of experimental observables with the use of gentle forces. Here, the…
Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is encountered in a number of different…
Recently, acoustic communication employing Orbital Angular Momentum (OAM) opens another avenue for efficient data transmission in aquatic environments. Current topological charge (TC) detection of OAM beams relies on the orthogonality among…
Contact Resonance Force Microscopy (CR-FM) is a leading AFM technique for measuring viscoelastic nano-mechanical properties. Conventional piezo-excited CR-FM measurements have been limited to imaging in air, since the "forest of peaks"…
A hybrid optoelectronic vibration sensing system is presented, combining a conventional charge-mode piezoelectric accelerometer with an optical fiber interface via a liquid crystal-based electrical-to-optical transducer. This configuration…
We assume that the sample height measured using AFM is reduced due to contact deformation. The Herz contact theory is applied for the quantitative description. General numerical solution is found. Analytical approximations for specific…
We demonstrate an accurate method to control the motion of a micromechanical oscillator in contact with a thermal bath. The experiment is carried out on the cantilever tip of an Atomic Force Microscope (AFM). Applying an appropriate time…
Milli-Kelvin atomic force microscopy (mK-AFM) presents an ongoing experimental challenge due to the intense vibrations in a cryogen-free dilution refrigerator and the low cooling power available at mK temperatures. A viable approach is to…
Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the…
We demonstrate the quantitative measurement of the magnetization of individual magnetic nanoparticles (MNP) using a magnetic force microscope (MFM). The quantitative measurement is realized by calibration of the MFM signal using an MNP…
The force between two interacting particles as a function of distance is one of the most fundamental curves in science. In this regard, Atomic Force Microscopy (AFM) represents the most powerful tool in nanoscience but with severe limits…