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Amorphous oxide semiconductors, especially indium oxide-based (InOx) thin-films, have been major candidates for high mobility with easy-to-use device processability. As one of the dopants in InOx semiconductors, we proposed Si to design a…

材料科学 · 物理学 2019-06-25 Shinya Aikawa , Toshihide Nabatame , Kazuhito Tsukagoshi

Amorphous metal oxide thin-film transistors (TFT) are fabricated using InOx-based semiconductors doped with TiO2, WO3 or SiO2. Although density of dopant is low in the film, change in the electrical properties showed strong dependence on…

材料科学 · 物理学 2013-10-25 Shinya Aikawa , Toshihide Nabatame , Kazuhito Tsukagoshi

Metal oxide thin-film transistors are fast becoming a ubiquitous technology for application in driving backplanes of organic light-emitting diode displays. Currently all commercial products rely on metal oxides processed via physical vapor…

Transparent oxide semiconductors (TOSs) based thin-film transistors (TFTs) that exhibit higher field effect mobility (uFE) are highly required toward the realization of next-generation displays. Among numerous types of TOS-TFTs, In2O3-based…

We reported here a high-performance In2O3/InZnO bilayer metal-oxide (BMO) thin-film transistor (TFT) using ultra-thin solution-processed ZrOx dielectric. A thin layer of In2O3 offers a higher carrier concentration, thereby maximizing the…

材料科学 · 物理学 2014-05-27 F. K. Shan , A. Liu , G. X. Liu , Y. Meng , B. C. Shin , E. Fortunato , R. Martins

Metal oxide (MO) semiconductors are widely used in electronic devices due to their high optical transmittance and promising electrical performance. This work describes the advancement toward an eco-friendly, streamlined method for preparing…

Oxide semiconductors have emerged as common channel materials in transistors and hold promise for next-generation electronics, yet achieving high mobility typically requires costly vacuum-based techniques. Here, ultrathin (5-nm) indium…

The evolution with carrier concentration of the electrical properties of amorphous indium oxide (InO) thin films has been studied using electronic double layer transistor configurations. Carrier variations of up to 7 X 10^(14) carriers/cm^2…

超导电性 · 物理学 2013-08-14 Yeonbae Lee , Aviad Frydman , Tianran Chen , Brian Skinner , A. M. Goldman

A significant anisotropy of the magnetic-field driven superconductor-insulator transition is observed in thin films of amorphous indium-oxide. The anisotropy is largest for more disordered films which have a lower transition field. At…

超导电性 · 物理学 2015-07-22 A. Johansson , N. Stander , E. Peled , G. Sambandamurthy , D. Shahar

Alloying of In/Zn oxides with various X atoms stabilizes the IXZO structures but generates electron traps in the compounds, degrading the electron mobility. To assess whether the latter is linked to the oxygen affinity or the ionic radius,…

介观与纳米尺度物理 · 物理学 2014-12-25 Mohammed Benwadih , J. A. Chroboczek , Gerard Ghibaudo , Romain Coppard , Dominique Vuillaume

A device and process strategy for achieving reliable indium gallium zinc oxide and indium oxide transistors compatible with a 400oC BEOL thermal budget and without performance degradation is demonstrated by fully exploiting intrinsic oxide…

In this paper, the dynamics of bias stress phenomenon in Sexithiophene (T6) Field Effect Transistors (FETs) has been investigated. T6 FETs have been fabricated by vacuum depositing films with thickness from 10 nm to 130 nm on Si/SiO2…

材料科学 · 物理学 2015-05-13 F. V. Di Girolamo , C. Aruta , M. Barra , P. D Angelo , A. Cassinese

Vanadium oxides are strongly correlated materials which display metal-insulator transitions as well as various structural and magnetic properties that depend heavily on oxygen stoichiometry. Therefore, it is crucial to precisely control…

材料科学 · 物理学 2020-12-21 Min-Han Lee , Yoav Kalcheim , Javier del Valle , Ivan K. Schuller

We present a novel method enabling precise post-fabrication modulation of the electrical resistance in micrometer-scale regions of amorphous indium oxide (a-InO$_x$) films. By subjecting initially insulating films to an electron beam at…

超导电性 · 物理学 2025-11-10 Iago F. Llovo , Julien Delahaye

Thin films of transition metal oxides open up a gateway to nanoscale electronic devices beyond silicon characterized by novel electronic functionalities. While such films are commonly prepared in an oxygen atmosphere, they are typically…

Under varying growth and device processing conditions, ultrabroadband photoconduction (UBPC) reveals strongly evolving trends in the defect density of states (DoS) for amorphous oxide semiconductor thin-film transistors (TFTs). Spanning the…

材料科学 · 物理学 2023-03-14 George W. Mattson , Kyle T. Vogt , John F. Wager , Matt W. Graham

Using isothermal and temperature-dependent electrical measurements, we investigated the resistive switching mechanism of amorphous titanium oxide thin films deposited by a plasma-enhanced atomic layer deposition method between two aluminum…

材料科学 · 物理学 2015-05-14 Hu Young Jeong , Jeong Yong Lee , Min-Ki Ryu , Sung-Yool Choi

Amorphous oxide semiconductors are gaining interest for logic and memory transistors compatible with low-temperature fabrication. However, their low thermal conductivity and heterogeneous interfaces suggest that their performance may be…

Amorphous semiconductors are important channel semiconductors in thin film transistors (TFTs) which serve not only active-matrix displays, but also flexible electronics for Internet of Things (IoT) applications. Nevertheless, a great…

应用物理 · 物理学 2025-11-18 Yuezhou Luo , Andrew John Flewitt

p-type doping from the dielectric/semiconductor interface of a SnO2 thin film transistor (TFT) has been utilized to develop high carrier mobility balanced ambipolar oxide-transistor. To introduce this interfacial-doping, bottom-gate…

应用物理 · 物理学 2020-01-07 Nitesh K. Chourasia , Anand Sharma , Nila Pal , Sajal Biring , Bhola N. Pal
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