相关论文: Accurate distance control between a probe and a su…
Short (40-200 microseconds) single focused CO2 laser pulses of energy of about 100 microJ were used to fabricate high quality concave micromirror templates on silica and fluoride glass. The ablated features have diameters of 20-100 microns…
Quartz tuning fork-based atomic force microscopy (QTF-AFM) has become a powerful tool for high-resolution imaging of both conductive and insulating samples, including semiconductor structures and metal-coated surfaces as well as soft matter…
We report on the realization of a quantum sensor based on trapped atom interferometry in an optical lattice for the measurement of atom-surface interactions, with sub-micrometer-level control of the mean atom-surface separation distance.…
In this paper, we report on new high-precision absolute distance measurements performed with frequency scanned interferometry using a pair of single-mode optical fibers. Absolute distances were determined by counting the interference…
This report describes a cantilever controller for magnetic resonance force microscopy (MRFM) based on a field programmable gate array (FPGA), along with the hardware and software used to integrate the controller into an experiment. The…
Simple feedback loops, inspired from extremum-seeking, are proposed to lock a probe-frequency to the transition frequency of a single quantum system following quantum Monte-Carlo trajectories. Two specific quantum systems are addressed, a…
The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…
We report development of a novel instrument to measure tracer diffusion in water under nano-scale confinement. A direct optical access to the confinement region, where water is confined between a tapered fiber and a flat substrate, is made…
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…
The \emph{Fr\'echet distance} is a well studied similarity measures between curves. The \emph{discrete Fr\'echet distance} is an analogous similarity measure, defined for a sequence $A$ of $m$ points and a sequence $B$ of $n$ points, where…
The implementation of a tuning fork sensor in a scanning force microscope operational at 300 mK is described and the harmonic oscillator model of the sensor is motivated. These sensors exhibit very high quality factors at low temperatures.…
In atomic force microscopy (AFM), the angle relative to the vertical ($\theta_{i}$) that the tip apex of a cantilever moves is determined by the tilt of the probe holder and the geometries of the cantilever and actuated eigenmode $i$. Even…
The roughness of fracture surfaces has been shown to exhibit self-affne scale invariance for a wide variety of materials and loading conditions. The range of scales over which this regime extends remains a matter of debate, together with…
Particles with high anisotropy in their magnetic properties and shape are of increasing interest for mechanobiology, where transducing a remotely applied magnetic field vector to a local mechanical response is crucial. An outstanding…
In this paper, we propose a scheme to eliminate the influence of noises on system dynamics, by means of a sequential unsharp measurements and unitary feedback operations. The unsharp measurements are carried out periodically during system…
We describe a single fingertip-mounted sensing system for robot manipulation that provides proximity (pre-touch), contact detection (touch), and force sensing (post-touch). The sensor system consists of optical time-of-flight range…
Magnetic force microscopy (MFM) is a well-established technique in scanning probe microscopy that allows for the imaging of magnetic samples with a spatial resolution of tens of nm and stray fields down to the mT range. The spatial…
Contact Resonance Force Microscopy (CR-FM) is a leading AFM technique for measuring viscoelastic nano-mechanical properties. Conventional piezo-excited CR-FM measurements have been limited to imaging in air, since the "forest of peaks"…
We analyze an advanced two-spring model with an ultra-low effective tip mass to predict nontrivial and physically rich 'fine structure' in the atomic stick-slip motion in Friction Force Microscopy (FFM) experiments. We demonstrate that this…
As a key method in dealing with uncertainties, feedback has been understood fairly well in classical control theory. But for quantum control systems, the capability of measurement-based feedback control (MFC) has not been investigated…