相关论文: Accurate distance control between a probe and a su…
This paper is a theoretical and a numerical investigation of the stability of a tip-cantilever system used in noncontact atomic force microscopy (NC-AFM) when it oscillates close to a surface. No additional dissipative force is considered.…
Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This is performed without reference to a global standard, which hinders robust comparison of…
We report a new spin manipulation protocol for periodically reversing the sample magnetization for Magnetic Resonance Force Microscopy. The protocol modulates the microwave excitation frequency synchronously with the position of the…
Casimir forces between conductors at the sub-micron scale cannot be ignored in the design and operation of micro-electromechanical (MEM) devices. However, these forces depend non-trivially on geometry, and existing formulae and…
Single-wall carbon nanotube (SWNT) nanofibrils were assembled onto conductive atomic force microscopy (AFM) probes with the help of dielectrophoresis (DEP). This process involved the application of a 10 V, 2 MHz, AC bias between a…
We report measurements of noncontact friction between surfaces of NbSe$_{2}$ and SrTiO$_{3}$, and a sharp Pt-Ir tip that is oscillated laterally by a quartz tuning fork cantilever. At 4.2 K, the friction coefficients on both the metallic…
Two ways of designing low-order discrete-time (i.e. digital) controls for low-order plant (i.e. process) models are considered in this tutorial. The first polynomial method finds the controller coefficients that place the poles of the…
A single-passage, bimodal magnetic force microscopy technique optimized for scanning samples with arbitrary topography is discussed. A double phase-locked loop (PLL) system is used to mechanically excite a high quality factor cantilever…
We present a formulation of measurement-based feedback control of a single quantum particle in one spatial dimension. An arbitrary linear combination of the position and momentum of the particle is continuously monitored, and feedback…
Often it is desirable to stabilize a system around an optimal state. This can be effectively accomplished using feedback control, where the system deviation from the desired state is measured in order to determine the magnitude of the…
Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…
The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample interaction for the NSMM. We observe that this length scale plays…
We study the reach control problem for affine systems on simplices, and the focus is on cases when it is known that the problem is not solvable by continuous state feedback. We examine from a geometric viewpoint the structural properties of…
We investigate the modification of photoluminescence (PL) from single semiconductor nanocrystal quantum dots (NCs) in proximity of metal and semiconducting Atomic Force Microscope (AFM) tips. The presence of the tip alters the radiative…
We developed THz-resonant scanning probe tips, yielding strongly enhanced and nanoscale confined THz near fields at their tip apex. The tips with length in the order of the THz wavelength ({\lambda} = 96.5 {\mu}m) were fabricated by focused…
Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…
A new method is introduced for calibrating lateral force as measured by an atomic force microscope (AFM), making use of both an interferometric detector and an optical beam detector on the same instrument. The method may be implemented…
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…
Accurate measurements of the Cosmic Microwave Background (CMB) anisotropy call for high precision and reliability of the in-flight calibration. For extended surveys the CMB dipole provides an excellent calibration source at frequencies…
We report on precision spectroscopy of sub-wavelength confined molecular gases. This was obtained by rovibrational selective reflection of $\mathrm{NH_3}$ and $\mathrm{SF_6}$ gases using a quantum cascade laser at $\lambda\approx 10.6 \mu…