中文
相关论文

相关论文: Lithography Hotspot Detection and Mitigation in Na…

200 篇论文

As technology scaling is approaching the physical limit, lithography hotspot detection has become an essential task in design for manufacturability. While the deployment of pattern matching or machine learning in hotspot detection can help…

机器学习 · 计算机科学 2021-08-02 Xuezhong Lin , Jingyu Pan , Jinming Xu , Yiran Chen , Cheng Zhuo

Layout hotpot detection is one of the main steps in modern VLSI design. A typical hotspot detection flow is extremely time consuming due to the computationally expensive mask optimization and lithographic simulation. Recent researches try…

机器学习 · 计算机科学 2018-07-18 Haoyu Yang , Shuhe Li , Cyrus Tabery , Bingqing Lin , Bei Yu

Recent advances in VLSI fabrication technology have led to die shrinkage and increased layout density, creating an urgent demand for advanced hotspot detection techniques. However, by taking an object detection network as the backbone,…

计算机视觉与模式识别 · 计算机科学 2024-09-17 Hao-Chiang Shao , Guan-Yu Chen , Yu-Hsien Lin , Chia-Wen Lin , Shao-Yun Fang , Pin-Yian Tsai , Yan-Hsiu Liu

At advanced process nodes, pattern matching techniques have been used in the detection of lithography hotspots, which can affect yields of manufactured integrated circuits. Although commercial pattern matching and in-design hotspot fixing…

其他计算机科学 · 计算机科学 2018-08-21 I-Lun Tseng , Valerio Perez , Yongfu Li , Zhao Chuan Lee , Vikas Tripathi , Jonathan Yoong Seang Ong

Lithography simulation is a critical step in VLSI design and optimization for manufacturability. Existing solutions for highly accurate lithography simulation with rigorous models are computationally expensive and slow, even when equipped…

Machine learning-based lithography hotspot detection has been deeply studied recently, from varies feature extraction techniques to efficient learning models. It has been observed that such machine learning-based frameworks are providing…

机器学习 · 计算机科学 2019-12-13 Haoyu Yang , Wen Chen , Piyush Pathak , Frank Gennari , Ya-Chieh Lai , Bei Yu

Continuous technology scaling and the introduction of advanced technology nodes in Integrated Circuit (IC) fabrication is constantly exposing new manufacturability issues. One such issue, stemming from complex interaction between design and…

机器学习 · 计算机科学 2020-07-14 Gaurav Rajavendra Reddy , Constantinos Xanthopoulos , Yiorgos Makris

Hotspot detection using thermal imaging has recently become essential in several industrial applications, such as security applications, health applications, and equipment monitoring applications. Hotspot detection is of utmost importance…

计算机视觉与模式识别 · 计算机科学 2023-08-28 Shreyas Goyal , Jagath C. Rajapakse

In computer chip manufacturing, the study of etch patterns on silicon wafers, or metrology, occurs on the nano-scale and is therefore subject to large variation from small, yet significant, perturbations in the manufacturing environment. An…

机器学习 · 计算机科学 2019-10-23 Jack Kenney , John Valcore , Scott Riggs , Edward Rietman

Characterizing materials using electron micrographs is crucial in areas such as semiconductors and quantum materials. Traditional classification methods falter due to the intricatestructures of these micrographs. This study introduces an…

计算机视觉与模式识别 · 计算机科学 2024-08-28 Sakhinana Sagar Srinivas , Geethan Sannidhi , Sreeja Gangasani , Chidaksh Ravuru , Venkataramana Runkana

At advanced process nodes, lithography weakpoints can exist in physical layouts of integrated circuit designs even if the layouts pass design rule checking (DRC). Existence of lithography weakpoints in a physical layout can cause…

其他计算机科学 · 计算机科学 2018-10-04 I-Lun Tseng , Yongfu Li , Valerio Perez , Vikas Tripathi , Zhao Chuan Lee , Jonathan Yoong Seang Ong

The nanoscale control afforded by scanning probe microscopes has prompted the development of a wide variety of scanning probe-based patterning methods. Some of these methods have demonstrated a high degree of robustness and patterning…

材料科学 · 物理学 2015-05-07 Ricardo Garcia , Armin W. Knoll , Elisa Riedo

High-density LED arrays enable high-speed transmission in image-sensor-based visible-light communication (VLC) systems. However, when optical spots become blurred and spatially overlapped due to focal shift, resolution limitations, or…

信息论 · 计算机科学 2026-05-19 Tianhao Shi , Shan Lu , Takaya Yamazato

Locimetric authentication is a form of graphical authentication in which users validate their identity by selecting predetermined points on a predetermined image. Its primary advantage over the ubiquitous text-based approach stems from…

密码学与安全 · 计算机科学 2022-04-04 Antonios Saravanos , Dongnanzi Zheng , Stavros Zervoudakis , Donatella Delfino

In semiconductor manufacturing, lithography has often been the manufacturing step defining the smallest possible pattern dimensions. In recent years, progress has been made towards high-NA (Numerical Aperture) EUVL…

计算机视觉与模式识别 · 计算机科学 2023-11-22 Vic De Ridder , Bappaditya Dey , Victor Blanco , Sandip Halder , Bartel Van Waeyenberge

Metasurfaces enable precise control over the properties of light and hold promise for commercial applications. However, fabricating visible metasurfaces suitable for high-volume production is challenging and requires scalable processes.…

High-resolution lithographic techniques are often limited by low volumetric throughput, since there is no universal and scalable manufacturing process that can produce 3D metasurfaces. In this work, we demonstrate a high-speed holographic…

Digital holographic microscopy is a powerful tool for characterizing transparent and reflective phase objects. Its ability to reconstruct amplitude and phase can also offer great insight into wavefront shaping and design of all-dielectric…

Miniaturizing nonlinear optical components is essential for integrating advanced light manipulation into compact photonic devices, enabling scalable and cost-effective applications. While monocrystalline lithium niobate thin films advance…

光学 · 物理学 2024-09-26 Ülle-Linda Talts , Helena C. Weigand , Irene Occhiodori , Rachel Grange

Mask-based pattern generation is a crucial step in microchip production. The next-generation extreme-ultraviolet- (EUV) lithography instruments with a wavelength of \SI{13.5}{\nano\meter} is currently under development. In principle, this…

应用物理 · 物理学 2019-02-13 Torstein Nesse , Ingve Simonsen , Bodil Holst
‹ 上一页 1 2 3 10 下一页 ›