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相关论文: Theory of small amplitude bimodal atomic force mic…

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Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two ore more resonance frequencies. Such excitation schemes result in one additional…

介观与纳米尺度物理 · 物理学 2014-11-19 Daniel Forchheimer , Stanislav S. Borysov , Daniel Platz , David B. Haviland

We consider an oscillator model to describe qualitatively friction force for an atomic force mi-croscope (AFM) tip driven on a surface described by periodic potential. It is shown that average value of the friction force could be controlled…

斑图形成与孤子 · 物理学 2020-10-06 E. V. Kazantseva , Y. Braiman , J. Barhen

We discuss the influence of external forces on the motion of the tip in dynamic atomic force microscopy (AFM). First, a compact solution for the steady-state problem is derived employing a Fourier approach. Founding on this solution, we…

介观与纳米尺度物理 · 物理学 2019-01-29 Tino Wagner

The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting atoms as a function of their separation. Atomic force…

应用物理 · 物理学 2024-06-19 Omur E Dagdeviren

With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments are based on…

应用物理 · 物理学 2018-12-24 Omur E. Dagdeviren , Yoichi Miyahara , Aaron Mascaro , Tyler Enright , Peter Grütter

In atomic force microscopy (AFM) tip-surface interactions are usually considered as functions of the tip position only, so-called force curves. However, tip-surface interactions often depend on the tip velocity and the past tip trajectory.…

介观与纳米尺度物理 · 物理学 2013-01-31 Daniel Platz , Daniel Forchheimer , Erik A. Tholén , David B. Haviland

We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…

材料科学 · 物理学 2007-05-23 Franz-Josef Elmer

Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…

仪器与探测器 · 物理学 2007-05-23 Robert W. Stark

Quantifying the tip-sample interaction at the nanoscale in Amplitude Modulation mode AFM is challenging, especially when measuring in liquids. Here, we derive formulas for the tip-sample conservative and dissipative interactions and…

仪器与探测器 · 物理学 2015-11-24 Luca Costa , Mario S Rodrigues

The interaction between a rapidly oscillating atomic force microscope tip and a soft material surface is described using both elastic and viscous forces with a moving surface model. We derive the simplest form of this model, motivating it…

This work is a theoretical investigation of the stability of the non-linear behavior of an oscillating tip-cantilever system used in dynamic force microscopy. Stability criterions are derived that may help to a better understanding of the…

原子与分子团簇 · 物理学 2016-08-16 Laurent Nony , Rodolphe Boisgard , Jean-Pierre Aimé

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple tones in a frequency comb. A high $Q$ cantilever resonance and…

介观与纳米尺度物理 · 物理学 2013-02-06 Daniel Platz , Daniel Forchheimer , Erik A. Tholén , David B. Haviland

The resonant buildup of light within optical microcavities elevates the radiation pressure which mediates coupling of optical modes to the mechanical modes of a microcavity. Above a certain threshold pump power, regenerative mechanical…

光学 · 物理学 2007-05-23 T. J. Kippenberg , H. Rokhsari , K. J. Vahala

We propose a two-frequency driving scheme in dynamic atomic force microscopy that maximizes the interaction time between tip and sample. Using a stochastic description of the cantilever dynamics, we predict large classical squeezing and a…

介观与纳米尺度物理 · 物理学 2022-01-20 Karl-Peter Marzlin , Bryan Canam , Nisha Rani Agarwal

It is generally thought that capillary interactions in nanoscale contacts give rise to unwanted behaviour due to high adhesion. We show that this is not the case for sufficiently small contacts in ambient conditions. High resolution ambient…

介观与纳米尺度物理 · 物理学 2015-06-15 Victor Barcons Sergio Santos William Bonass Josep Font Neil H Thomson

Atomic scale friction, an indispensable element of nanotechnology, requires a direct access to, under actual growing shear stress, its successive live phases: from static pinning, to depinning and transient evolution, eventually ushering in…

材料科学 · 物理学 2021-02-23 Antoine Lainé , Andrea Vanossi , Antoine Niguès , Erio Tosatti , Alessandro Siria

We adjust the transient dynamics of a piezo-actuated bimorph Atomic Force Microscopy (AFM) probe using a state feedback controller. This approach enables us to adjust the quality factor and the resonance frequency of the probe…

原子物理 · 物理学 2012-04-16 Bilal Orun , Serkan Necipoglu , Cagatay Basdogan , Levent Guvenc

In the Tapping mode, a variation of the oscillation amplitude and phase as a function of the tip sample distance is the necessary measurement to access quantitatively to the properties of the surface. In the present work, we give a…

原子与分子团簇 · 物理学 2016-08-16 Jean-Pierre Aimé , Rodolphe Boisgard , Laurent Nony , Gérard Couturier

In multifrequency atomic force microscopy higher eigenmodes are externally excited to enhance resolution and contrast while simultaneously increasing the number of experimental observables with the use of gentle forces. Here, the…

介观与纳米尺度物理 · 物理学 2014-07-14 Sergio Santos , Victor Barcons

Direct time-varying tip-sample force measurements by torsional harmonic cantilevers facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force microscopy. Here we report experimental evidence that the…

仪器与探测器 · 物理学 2008-11-26 Ozgur Sahin
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