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相关论文: Friction force microscopy: a simple technique for …

200 篇论文

Since the discovery of the Amonton's law and with support of modern tribological models, friction between surfaces of three-dimensional materials is known to generally increase when the surfaces are in closer contact. Here, using molecular…

介观与纳米尺度物理 · 物理学 2012-10-30 A. Smolyanitsky , J. P. Killgore

We report fast atom diffraction through single-layer graphene using hydrogen atoms at kinetic energies from 150 to 1200 eV. High-resolution images reveal overlapping hexagonal patterns from coexisting monocrystalline domains. Time-of-flight…

We demonstrate molecular beam growth of graphene on biotite mica substrates at temperatures below 1000{\deg}C. As indicated by optical and atomic force microscopy, evaporation of carbon from a high purity solid-state source onto biotite…

Graphene is a 2D material that displays excellent electronic transport properties with prospective applications in many fields. Inducing and controlling magnetism in the graphene layer, for instance by proximity of magnetic materials, may…

We have measured the mechanical properties of few-layer graphene and graphite flakes that are suspended over circular holes. The spatial profile of the flake's spring constant is measured with an atomic force microscope. The bending…

介观与纳米尺度物理 · 物理学 2012-03-16 Menno Poot , Herre S. J. van der Zant

Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…

The deformation and fracture behaviour of one-atom-thick mechanically exfoliated graphene has been studied in detail. Monolayer graphene flakes with different lengths, widths and shapes were successfully prepared by mechanical exfoliation…

材料科学 · 物理学 2019-08-06 Xin Zhao , Dimitrios G. Papageorgiou , Liyan Zhu , Feng Ding , Robert J. Young

We demonstrate the growth of graphene nanocrystals by molecular beam methods that employ a solid carbon source, and that can be used on a diverse class of large area dielectric substrates. Characterization by Raman and Near Edge X-ray…

Barrium fluoride (BaF2) thin films were prepared by electron beam evaporation technique at room temperature, on glass, Silicon and Aluminum substrates having thickness of 20 nm each. Its structural property and surface morphology were…

材料科学 · 物理学 2017-05-22 Kavyashree , R. K. Pandey , R. P. Yadav , Manvendra Kumar , A. K. Mittal , A. C. Pandey , S. N. Pandey

We report on an alternative route based on nanomechanical folding induced by AFM tip to obtain weakly interacting multi-layer graphene (wi-MLG) from a chemical vapor deposition (CVD) grown single-layer graphene (SLG). The tip first cuts,…

介观与纳米尺度物理 · 物理学 2019-07-26 C. Pardanaud , A. Merlen , K Gratzer , O. Chuzel , D Nikolaievskyi , L. Patrone , S. Clair , R Ramirez Jimenez , A de Andrés , P. Roubin , J. -L Parrain

Graphene grown epitaxially on SiC has been proposed as a material for carbon-based electronics. Understanding the interface between graphene and the SiC substrate will be important for future applications. We report the ability to image the…

We demonstrate that it is possible to mechanically exfoliate graphene under ultra high vacuum conditions on the atomically well defined surface of single crystalline silicon. The flakes are several hundred nanometers in lateral size and…

材料科学 · 物理学 2015-06-05 O. Ochedowski , G. Begall , N. Scheuschner , M. El Kharrazi , J. Maultzsch , M. Schleberger

We report here that atomic force microscope (AFM) in frictional force mode can be used to detect onset of chain scission and crosslinking in polymeric and macromolecular samples upon irradiation. A systematic investigation to detect chain…

材料科学 · 物理学 2009-09-29 S. Banerjee , N. K. Sinha , N. Gayathri , D. Ponraju , S. Dash , A. K. Tyagi , Baldev Raj

Manipulation of metal nanoparticles using atomic force microscope is a promising new technique for probing tribological properties at the nanoscale. In spite of some advancements in experimental investigations, there is no unambiguous…

介观与纳米尺度物理 · 物理学 2010-11-25 Alexei V. Khomenko , Nikolay V. Prodanov

Point Projection Microscopy (PPM) is used to image suspended graphene using low-energy electrons (100-200eV). Because of the low energies used, the graphene is neither damaged or contaminated by the electron beam. The transparency of…

介观与纳米尺度物理 · 物理学 2015-03-18 J. Y. Mutus , L. Livadaru , J. T. Robinson , R. Urban , M. H. Salomons , M. Cloutier , P. E. Sheehan , R. A. Wolkow

Graphene, a single atomic layer of graphitic carbon, has attracted intense attention due to its extraordinary properties that make it a suitable material for a wide range of technological applications. Large-area graphene films, which are…

介观与纳米尺度物理 · 物理学 2015-02-18 Oleg V. Yazyev , Yong P. Chen

The electronic properties of graphene can be modified by the local interaction with a selected metal substrate. To probe this effect, Scanning Tunneling Microscopy is widely employed, particularly by means of local measurement via lock-in…

介观与纳米尺度物理 · 物理学 2023-05-01 Virginia Carnevali , Alessandro Sala , Pietro Biasin , Mirco Panighel , Giovanni Comelli , Maria Peressi , Cristina Africh

Light-sheet fluorescence microscopy (LSFM) is used to capture volume images of biological specimens. It offers high contrast deep inside densely fluorescence labelled samples, fast acquisition speed and minimal harmful effects on the…

图像与视频处理 · 电气工程与系统科学 2024-04-05 Niklas Rottmayer , Claudia Redenbach , Florian Fahrbach

Structure and dynamics at soft-matter interfaces play an important role in nature and technical applications. Optical single-molecule investigations are non-invasive and capable to reveal heterogeneities at the nanoscale. In this work we…

Automatic detection and tracking of cells in microscopy images are major applications of computer vision technologies in both biomedical research and clinical practice. Though machine learning methods are increasingly common in these…

计算机视觉与模式识别 · 计算机科学 2023-12-07 Nikomidisz Eftimiu , Michal Kozubek