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相关论文: Friction force microscopy: a simple technique for …

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We present a unique experimental configuration that allows us to determine the interfacial forces on nearly parallel plates made from the thinnest possible mechanical structures, single and few layer graphene membranes. Our approach…

As a viable candidate for an all-carbon post-CMOS electronics revolution, epitaxial graphene has attracted significant attention. To realize its application potential, reliable methods for fabricating large-area single-crystalline graphene…

The simultaneous combination of scanning probe methods (tunnelling and force microscopies, STM and AFM) is a unique way to get an information about crystallographic and electronic structure of the studied surface. Here we apply these…

Friction Stir Processing is a relatively new technique which has been developed for microstructural modification of metallic materials through intense, localized plastic deformation. The current research work deals with the development of…

应用物理 · 物理学 2018-03-01 R. Rahul , K. V. Rajulapati , G. M. Reddy , K. B. S. Rao

An atomic force microscope is used to structure a film of multilayer graphene. The resistance of the sample was measured in-situ during nanomachining a narrow trench. We found a reversible behavior in the electrical resistance which we…

介观与纳米尺度物理 · 物理学 2008-07-28 P. Barthold , T. Luedtke , R. J. Haug

Observing the individual building blocks of matter is one of the primary goals of microscopy. The invention of the scanning tunneling microscope [1] revolutionized experimental surface science in that atomic-scale features on a solid-state…

材料科学 · 物理学 2008-08-04 Jannik C. Meyer , C. O. Girit , M. F. Crommie , A. Zettl

The study of the nanomechanics of graphene $-$ and other 2D materials $-$ has led to the discovery of exciting new properties in 2D crystals, such as their remarkable in-plane stiffness and out of plane flexibility, as well as their unique…

材料科学 · 物理学 2019-02-14 Filippo Cellini , Francesco Lavini , Claire Berger , Walt de Heer , Elisa Riedo

Pristine monocrystalline graphene is claimed to be the strongest material known with remarkable mechanical and electrical properties. However, graphene made with scalable fabrication techniques is polycrystalline and contains inherent…

材料科学 · 物理学 2016-02-02 Ashivni Shekhawat , Robert O. Ritchie

We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…

材料科学 · 物理学 2007-05-23 Franz-Josef Elmer

Gold is widely used as the substrate material in many graphene devices, due to its superior optoelectronic properties and chemical stability. However, there has been little experimental investigation on the optical contrast of graphene…

Graphite is a well-studied material with known electronic and optical properties. Graphene, on the other hand, which is just one layer of carbon atoms arranged in a hexagonal lattice, has been studied theoretically for quite some time but…

介观与纳米尺度物理 · 物理学 2015-05-13 F. Molitor , D. Graf , C. Stampfer , T. Ihn , K. Ensslin

We use a cooled Scanning Probe Microscope (SPM) to electron motion in nanoscale devices. The charged tip of the SPM is raster scanned at a constant height above the surface as the conductance of the device is measured. The image charge…

介观与纳米尺度物理 · 物理学 2017-03-08 Sagar Bhandari , Gil-Ho Lee , Philip Kim , Robert M. Westervelt

Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…

介观与纳米尺度物理 · 物理学 2025-04-21 Roger Proksch , Ryan Wagner

This work proposes an investigation on the scaling of the structural strength of polymer/graphene nanocomposites. To this end, fracture tests on geometrically scaled Single Edge Notch Bending (SENB) specimens with varying contents of…

材料科学 · 物理学 2018-10-10 Cory Hage Mefford , Yao Qiao , Marco Salviato

The functional properties of many technological surfaces in biotechnology, electronics, and mechanical engineering depend to a large degree on the individual features of their nanoscale surface texture, which in turn are a function of the…

We prepared thin layers of amorphous silicon by deposition of a liquid-phase polysilane precurser on glass substrate. Raman scattering provides evidence for residual tensile stress in the silicon, which is evaluated quantitatively. Under…

应用物理 · 物理学 2019-08-20 Torsten Bronger

The extreme sensitivity of 2D materials to defects and nanostructure requires precise imaging techniques to verify presence of desirable and absence of undesirable features in the atomic geometry. Helium-ion beams have emerged as a…

材料科学 · 物理学 2022-05-19 Alina Kononov , Alexandra Olmstead , Andrew D. Baczewski , Andre Schleife

Graphene based sheets have stimulated great interest due to their superior mechanical, electrical and thermal properties. A general visualization method that allows quick observation of these single atomic layers would be highly desirable…

材料科学 · 物理学 2009-12-15 Jaemyung Kim , Laura J. Cote , Franklin Kim , Jiaxing Huang

We report a detailed investigation of low-frequency resistance fluctuations (1/f noise) in chemical vapor deposition (CVD) grown graphene. Systematic measurements reveal that the magnitude of 1/f noise in CVD-grown graphene is significantly…

介观与纳米尺度物理 · 物理学 2026-03-17 Jagadis Prasad Nayak , Smrutirekha Sahoo , Shreya Barman , Gopi Nath Daptary

Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals…