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Reflectometry is a technique that uses the light reflected by a sample to determine properties of the sample. Interferometric reflectometry uses interference between two beams, one of which is incident on ---and reflected back by--- a…

光学 · 物理学 2019-10-10 Alexander Nahmad-Rohen , Wolfgang Langbein

Topological insulators are a new phase of matter that exhibits exotic surface electronic properties. Determining the spin texture of this class of material is of paramount importance for both fundamental understanding of its topological…

介观与纳米尺度物理 · 物理学 2013-02-26 Yihua Wang , Nuh Gedik

Wide-field imaging Mueller polarimetry is a revolutionary, label-free, and non-invasive modality for computer-aided intervention: in neurosurgery it aims to provide visual feedback of white matter fibre bundle orientation from derived…

A polarization camera can capture four linear polarized images with different polarizer angles in a single shot, which is useful in polarization-based vision applications since the degree of linear polarization (DoLP) and the angle of…

计算机视觉与模式识别 · 计算机科学 2025-05-19 Chu Zhou , Minggui Teng , Xinyu Zhou , Chao Xu , Imari Sato , Boxin Shi

Complete polarimeters deliver the full polarization transfer matrix of a medium that relates input polarization states to output polarization states. In order to interpret the Mueller matrix of a luminescent medium at the emission…

光学 · 物理学 2017-10-30 Shane Nichols , Melissa Tan , Alexander Martin , Bart Kahr

We consider a method for obtaining information on polarization of astronomical objects radiation at diffraction limited resolution - differential speckle polarimetry. As an observable we propose to use averaged cross spectrum of two…

天体物理仪器与方法 · 物理学 2015-06-12 Boris Safonov

An atomic magnetometer operated with elliptically polarized light is investigated theoretically and experimentally. To explore the potential of this magnetometric configuration, the analytical form of the outgoing signal is derived.…

原子物理 · 物理学 2020-01-08 Shengran Su , Guoyi Zhang , Xin Bi , Xiang He , Wenqiang Zheng , Qiang Lin

Accurately measuring the geometry and spatially-varying reflectance of real-world objects is a complex task due to their intricate shapes formed by concave features, hollow engravings and diverse surfaces, resulting in inter-reflection and…

计算机视觉与模式识别 · 计算机科学 2024-12-16 Jing Yang , Pratusha Bhuvana Prasad , Qing Zhang , Yajie Zhao

Polarizing microscopy brought about many advancements in the science of liquid crystals and other soft materials, including those of biological origin. Recent developments in optics and computer-based analysis enabled a new generation of…

光学 · 物理学 2022-11-02 Mojtaba Rajabi , Oleg Lavrentovich , Michael Shribak

(Electric) polarization tensors describe part of the leading order term of asymptotic voltage perturbations caused by low volume fraction inhomogeneities of the electrical properties of a medium. They depend on the geometry of the support…

偏微分方程分析 · 数学 2015-09-25 Roland Griesmaier , Martin Hanke

An approach for measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics is described. A set of multilayer-coated flats reflect the dispersed X-rays to the instrument detectors. The intensity variation…

天体物理学 · 物理学 2009-11-13 Herman L. Marshall

The purpose of this article is to present a new broadband Mueller ellipsometer designed to work in the mid-infrared range, from 3 to 14 microns. The Mueller ellipsometer, which can be mounted in reflection or in transmission configuration,…

Generalized ellipsometry, a non-destructive optical characterization technique, is employed to determine geometrical structure parameters and anisotropic dielectric properties of highly spatially coherent three-dimensionally nanostructured…

光学 · 物理学 2015-06-16 Daniel Schmidt

Current optical manipulation techniques rely on carefully engineered setups and samples. Although similar conditions are routinely met in research laboratories, it is still a challenge to manipulate microparticles when the environment is…

光学 · 物理学 2014-07-22 Giorgio Volpe , Lisa Kurz , Agnese Callegari , Giovanni Volpe , Sylvain Gigan

Beginning with a historical account of the spectral classification, its refinement through additional criteria is presented. The line strengths and ratios used in two dimensional classifications of each spectral class are described. A…

太阳与恒星天体物理 · 物理学 2015-05-18 Sunetra Giridhar

Polarization is a degree of freedom of light carrying important information that is usually absent in intensity and spectral content. Imaging polarimetry is the process of determining the polarization state of light, either partially or…

光学 · 物理学 2018-03-12 Ehsan Arbabi , Seyedeh Mahsa Kamali , Amir Arbabi , Andrei Faraon

A new formalism of beam-optics and polarization has been recently presented, based on an exact matrix representation of the Maxwell equations. This is described in Part-I and Part-II. In this Part, we present the application of the above…

光学 · 物理学 2007-05-23 Sameen Ahmed Khan

High precision polarization measurements open new opportunities for the study of the magnetic field structure as traced by polarimetric measurements of the interstellar dust emission. Polarization parameters suffer from bias in the presence…

星系天体物理 · 物理学 2017-03-15 D. Alina , L. Montier , I. Ristorcelli , J. -P. Bernard , F. Levrier , E. Abdikamalov

We describe a self calibrating optical technique that allows to perform absolute measurements of scattering cross sections for the light scattered at extremely small angles. Very good performances are obtained by using a very simple optical…

光学 · 物理学 2009-11-10 Doriano Brogioli , Alberto Vailati , Marzio Giglio

Digital holography measures the complex optical field and transfer matrix of a device, polarization-diversity is often achieved through spatial multiplexing. We introduce angular multiplexing, to increase flexibility in the optical setup.…