相关论文: Application of Spectroscopic Ellipsometry and Muel…
Light Polarization has many technological applications and its discovery was crucial to reveal the transverse nature of the electromagnetic waves. However, despite its fundamental and practical importance, in high school this property of…
We examine the utility of employing polarized lepton (electron and muon) beams to perform indirect searches for scalar leptoquarks. We find that polarization can extend the reach in excluding leptoquark masses for both $e^+e^-$ and…
We present a novel analysis method for measurements of polarization transferred in $A(\vec{e},e'\vec{N})$ experiments, which can be applied to other kinds of polarization measurements as well. In this method the polarization transfer…
Researchers routinely characterize optical samples by computing the scattering cross-section. However, the experimental determination of this magnitude requires the measurement and integration of the components of the scattered field in all…
We study the free-propagation features of an optical field endowed with a non-uniform polarization pattern with elliptical symmetry. The fields derived in this way are called Elliptically Symmetric Polarized Beams (ESPB for short). Some…
Symmetry relationships for optical observations of matter generally fall into several common scattering geometries. The 'planetary' configuration is preferred among a group of observers of extraterrestrial planets, 'laboratory' observations…
The translation of imaging Mueller polarimetry to clinical practice is often hindered by large footprint and relatively slow acquisition speed of the existing instruments. Using polarization-sensitive camera as a detector may reduce…
Plasmonic metasurfaces enable simultaneous control of the phase, momentum, amplitude and polarisation of light and hence promise great utility in realisation of compact photonic devices. In this paper, we demonstrate a novel chip-scale…
We classify proper holomorphic mappings between generalized pseudoellipsoids of different dimensions. Those domains are parametrized by the exponents. The relations among them are also obtained. Main tool is the orthogonal decomposition of…
Mueller matrices (MMs) encode information on geometry and material properties, but recovering both simultaneously is an ill-posed problem. We explore whether MMs contain sufficient information to infer surface geometry and material…
Optical tweezers are powerful tools based on focused laser beams. They are able to trap, manipulate and investigate a wide range of microscopic and nanoscopic particles in different media, such as liquids, air, and vacuum. Key applications…
Spectroscopic ellipsometry is a potent method that is widely adopted for the measurement of thin film thickness and refractive index. However, a conventional ellipsometer, which utilizes a mechanically rotating polarizer and grating-based…
Polarization scramblers are essential for many imaging applications involving polarization sensitive instruments and partially polarized fluxes. In such cases, the light must be depolarized to allow properly calibrated measurements. Several…
The shapelets method for image analysis is based upon the decomposition of localised objects into a series of orthogonal components with convenient mathematical properties. We extend the "Cartesian shapelet" formalism from earlier work, and…
Detection of cervical intraepithelial Neoplasia (CIN) at the early stage enables prevention of cervical cancer, which is one of the leading cause of cancer deaths among women. Recently there is a great interest to use the optical…
The maturity of current detectors based on technologies that range from solid state to gases renewed the interest for X-ray polarimetry, raising the enthusiasm of a wide scientific community to improve the performance of polarimeters as…
The algorithm is described, which have been used for photo-polarimetric monitoring of various astronomical objects - cataclysmic variables, asteroids, comets.
We present an optical metrology system for characterization of topography of micro/nano-structures on a surface or embedded in a semi-transparent material. Based on the principles of scatterometry, where the intensity of scattered light is…
Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor interfaces. In this work, solid-liquid interfaces are studied using the Kretschmann-Raether configuration for biosensing applications. The…
For a wide range of applications a fast, non-destructive, remote, and sensitive identification of samples with predefined characteristics is preferred instead of their full characterization. Here, we report on the experimental…