相关论文: Application of Spectroscopic Ellipsometry and Muel…
Ellipsometry is a technique whereby the measurement of the two orthogonal polarization components of light reflected at glancing incidence allows a characterization of the optical properties of a material at a particular frequency.…
Many polarisation techniques have been harnessed for decades in biological and clinical research, each based upon measurement of the vectorial properties of light or the vectorial transformations imposed on light by objects. Various…
Advances in vectorial polarisation-resolved imaging are bringing new capabilities to applications ranging from fundamental physics through to clinical diagnosis. Imaging polarimetry requires determination of the Mueller matrix (MM) at every…
When light scatters off an object its polarization, in general, changes - a transformation described by the object's Mueller matrix. Mueller matrix imaging polarimetry is an important technique in science and technology to image the…
In this chapter we present a brief summary of methods, instruments and calibration techniques used in modern astronomical polarimetry in the optical wavelengths. We describe the properties of various polarization devices and detectors used…
Spectroscopic ellipsometry (SE) has emerged as a powerful and non-destructive optical characterization technique for probing the complex dielectric properties of two-dimensional (2D) materials. This review provides a comprehensive overview…
Material classification is a fundamental problem in computer vision and plays a crucial role in scene understanding. Previous studies have explored various material recognition methods based on reflection properties such as color, texture,…
Polarizers are key components in optical science and technology. Thus, understanding the action of a polarizer beyond oversimplifying approximations is crucial. In this work, we study the interaction of a polarizing interface with an…
In recent decades, the relevance of polarimetry in planetary sciences and astronomy has increased rapidly. Polarization is a fundamental property of light and can be modified by any scattering event. As such, polarization yields additional…
Astronomical polarimetry is a powerful technique that can provide physical information sometimes difficult or impossible to obtain by any other type of observation. Almost every class of binary star can benefit from polarimetric…
Mueller polarimetry involves a variety of instruments and technologies whose importance and scope of applications are rapidly increasing. The exploitation of these powerful resources depends strongly on the mathematical models that underlie…
Polarization is a basic property of light and is fundamentally linked to the internal geometry of a source of radiation. Polarimetry complements photometric, spectroscopic, and imaging analyses of sources of radiation and has made possible…
Ellipsometry is a powerful and well-established optical technique used in the characterisation of materials. It works by combining the components of elliptically polarized light in order to draw information about the optical system. We…
We present a new approach for correcting instrumental polarization by modeling the non-depolarizing effects of a complex series of optical elements to determine physically realizable Mueller matrices. Provided that the Mueller matrix of the…
In polarimetry it is important to characterize the polarization properties of the instrument itself to disentangle real astrophysical signals from instrumental effects. This article deals with the accurate measurement and modeling of the…
An analysis of the matrix models representing the polarimetric properties of light and material media is carried out by using the concept of the coherency matrix, which leads to the identification and definition of their corresponding…
We experimentally investigate the depolarizing power and the polarization entropy of a broad class of scattering optical media. By means of polarization tomography, these quantities are derived from an effective Mueller matrix, which is…
In spectroscopic ellipsometry, the optical properties of materials are obtained indirectly by generally assuming dielectric function and optical models. This ellipsometry analysis, which typically requires numerous model parameters, has…
This book outlines the basic physical principles and practical methods of polarimetric remote sensing of Solar System objects and summarizes numerous advanced applications of polarimetry in geophysics and planetary astrophysics. In the…
Mueller matrices provide a complete description of a medium's response to excitation by polarized light, and their characterization is important across a broad range of applications from ellipsometry in material science to polarimetry in…