相关论文: Characterizing Voltage Contrast in Photoelectron E…
A comparison of the performance of high resolution lithographic tools is presented here. We use extreme ultraviolet interference lithography, electron beam lithography, and He ion beam lithography tools on two different resists that are…
We have made an observation of 45 MeV electron beam bunches using the nondestructive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with the…
The resistive-pulse technique provides a fast and label-free method for nanoparticle detection. In order to achieve a higher sensitivity, thin nanopores, such as silicon nitride pores, are usually considered. In this paper, nanoparticle…
We use simultaneous electronic transport and optical characterization measurements to reveal new information about electronic and optical processes in nanoscale junctions fabricated by electromigration. Comparing electronic tunneling and…
The ionization dynamics of pure He nanodroplets irradiated by EUV radiation is studied using Velocity-Map Imaging PhotoElectron-PhotoIon COincidence (VMI-PEPICO) spectroscopy. We present photoelectron energy spectra and angular…
The standard method to determine physical parameters of piezoceramics, established by IEEE, has been utilized for decades by the number of researchers, yet it omits presence of important loss factors and possesses serious deficits that…
In a particle beam microscope, a raster-scanned focused beam of particles interacts with a sample to generate a secondary electron (SE) signal pixel by pixel. Conventionally formed micrographs are noisy because of limitations on acquisition…
In a recent article [Phys. Rev. Applied 5, 024005 (2016)], Gibelli and coworkers proposed a method to determine the thermopower, i.e. the Seebeck coefficient, using photoluminescence measurements. The photoluminescence spectra are used to…
Synchrotron based photoemission electron microscopy with energy filter combines real space imaging with microprobe diffraction ($\mu$-ARPES), giving access to the local electronic structure of laterally inhomogeneous materials. We present…
Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…
For the first time a vertically polarized electron beam has been used for physics experiments at MAMI in the energy range between 180 and 855 MeV. The beam-normal single-spin asymmetry $A_{\mathrm{n}}$, which is a direct probe of…
Chemical defects in polyethylene (PE) can deleteriously downgrade its electrical properties and performance. Although these defects usually leave spectroscopic signatures in terms of characteristic luminescence peaks, it is nontrivial to…
Electron vortex beams carry well-defined orbital angular momentum (OAM) about the propagation axis. Such beams are thus characterised by chirality features which make them potentially useful as probes of magnetic and other chiral materials.…
In differential phase contrast scanning transmission electron microscopy (DPC-STEM), variability in dynamical diffraction resulting from changes in sample thickness and local crystal orientation (due to sample bending) can produce contrast…
Serial section electron microscopy (ssEM) is a widely used technique for obtaining volumetric information of biological tissues at nanometer scale. However, accurate 3D reconstructions of identified cellular structures and volumetric…
Total electron yield (TEY) imaging is an established scanning transmission X-ray microscopy (STXM) technique that gives varying contrast based on a sample's geometry, elemental composition, and electrical conductivity. However, the TEY-STXM…
An effective yet simple means disclosed herewith has allowed us to gain the atomistic, local, and quantitative information of bonds and electrons at sites surrounding undercoordinated atoms, complementing the scanning tunneling…
One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged…
Studying the electrical signals generated by living cells is key to understanding numerous biological phenomena. Electrochromic optical recording (ECORE) uses the electrochromism exhibited by certain materials to noninvasively measure these…
Using a new technique to directly detect current induced on a nearby electrode, we measure plasma oscillations in ultracold plasmas, which are influenced by the inhomogeneous and time-varying density and changing neutrality. Electronic…