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相关论文: Simulation of interstitial diffusion of ion-implan…

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It has been shown that many of the phenomena related to the formation of "tails" in the low-concentration region of ion-implanted impurity distribution are due to the anomalous diffusion of nonequilibrium impurity interstitials. These…

材料科学 · 物理学 2015-05-30 O. I. Velichko , A. P. Kavaliova

A two stream model of boron diffusion in silicon has been developed. The model is intended for simulation of transient enhanced diffusion including redistribution of ion-implanted boron during low temperature annealing. The following…

材料科学 · 物理学 2011-05-24 O. I. Velichko , A. A. Hundorina

A theoretical investigation of the microscopic mechanisms provided the transient enhanced diffusion of boron atoms during rapid thermal annealing of silicon substrates doped by high fluence ion implantation was carried out. To compare the…

介观与纳米尺度物理 · 物理学 2010-07-23 O. I. Velichko , A. A. Hundoryna

Modeling of the long-range migration of boron interstitials during low temperature annealing of ion-implanted silicon crystals has been carried out.

材料科学 · 物理学 2012-07-04 O. I. Velichko , A. P. Kavaliova

It has been shown by means of impurity diffusion simulation that ion-implanted boron redistribution at the annealing temperatures 800^{\circ}C and lower is governed by the long-range migration of nonequilibrium impurity interstitials…

材料科学 · 物理学 2011-06-27 O. I. Velichko , A. P. Kavaliova

A model of interstitial impurity migration is proposed which explains the redistribution of ion-implanted boron in low-temperature annealing of nonamorphized silicon layers. It is supposed that nonequilibrium boron interstitials are…

材料科学 · 物理学 2015-04-15 O. I. Velichko

Modeling of ion-implanted boron redistribution in silicon crystals during low-temperature annealing with a small thermal budget has been carried out. It was shown that formation of "tails"' in the low-concentration region of impurity…

材料科学 · 物理学 2015-06-05 O. I. Velichko , A. P. Kavaliova

It has been shown that during thermal treatments of silicon layers preamorphized by germanium implantation and then implanted with boron ions the transport of impurity atoms occurs right up to a temperature of 850^{\circ}C due to migration…

材料科学 · 物理学 2011-06-20 O. I. Velichko , A. A. Hundorina , V. V. Axenov

The mechanism underlying the long-range interstitial migration of nonequilibrium impurity interstitial species is used to simulate arsenic redistribution in ion implantation. An excellent agreement of the calculated arsenic concentration…

材料科学 · 物理学 2015-06-11 O. I. Velichko

Modeling of the phosphorus radiation-enhanced diffusion in the course of implantation of high-energy protons into an elevated-temperature silicon substrate and during its treatment in a hydrogen-containing plasma with addition of a…

材料科学 · 物理学 2014-10-24 O. I. Velichko

The model of transient enhanced diffusion of ion-implanted As is formulated and the finite-difference method for numerical solution of the system of equations obtained is developed. The nonuniform distribution of point defects near the…

材料科学 · 物理学 2007-05-23 O. I. Velichko , A. M. Mironov , V. A. Tsurko , G. M. Zayats

To simulate the transient enhanced diffusion near the surface or interface, a set of equations describing the impurity diffusion and quasichemical reactions of dopant atoms and point defects in ion-implanted layers is proposed and analyzed.…

材料科学 · 物理学 2007-05-23 O. I. Velichko , Yu. P. Shaman , A. K. Fedotov , A. V. Masanik

The model of hydrogen migration and of the reactions of hydrogen atoms with electrically active impurity, developed earlier, has been applied to simulate hydrogen diffusion and passivation process during plasma deuteration of silicon…

材料科学 · 物理学 2015-06-12 O. I. Velichko , Yu. P. Shaman , A. P. Kovaliova

The analytical solutions of the equations describing impurity diffusion due to migration of nonequilibrium impurity interstitials were obtained for the impurity redistribution during ion implantation at elevated temperatures and for…

材料科学 · 物理学 2008-02-24 O. I. Velichko , N. A. Sobolevskaya

The theoretical analysis of the process of diffusion of interstitial oxygen atoms and hydrogen molecules in silicon and germanium crystals has been performed. The calculated values of the activation energy and pre-exponential factor for an…

材料科学 · 物理学 2007-05-23 Vasilii Gusakov

Boron implantation with in-situ dynamic annealing is used to produce highly conductive sub-surface layers in type IIa (100) diamond plates for the search of a superconducting phase transition. Here we demonstrate that high-fluence MeV…

Tungsten is a promising candidate material for plasma-facing armour components in future fusion reactors. A key concern is irradiation-induced degradation of its normally excellent thermal transport properties. In this comprehensive study,…

材料科学 · 物理学 2021-11-16 Abdallah Reza , Guanze He , Cody A. Dennett , Hongbing Yu , Kenichiro Mizohata , Felix Hofmann

Micron-thick boron films have been deposited by Pulsed Laser Deposition in vacuum on several substrates at room temperature. The use of high energy pulses (>700 mJ) results in the deposition of smooth coatings with low oxygen uptake even at…

First-principles atomistic molecular dynamics simulation in the micro-canonical and canonical ensembles has been used to study the diffusion of interstitial hydrogen in $\alpha$-iron. Hydrogen to Iron ratios between $\theta=1/16 and 1/2…

材料科学 · 物理学 2011-06-03 J. Sanchez , F. Fullea , M. C. Andrade , P. L. de Andres

Enhanced diffusion of gold atoms into silicon substrate has been studied in Au thin films of various thicknesses (2.0, 5.3, 10.9 and 27.5 nm) deposited on Si(111) and followed by irradiation with 1.5 MeV Au2+ at a flux of 6.3x10^12 ions…

材料科学 · 物理学 2009-11-13 J. Ghatak , B. Sundaravel , K. G. M. Nair , P. V. Satyam
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