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相关论文: Effect of intrinsic instability of cantilevers on …

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We find that the jump-into-contact of the cantilever in the atomic force microscope (AFM) is caused by an inherent instability in the motion of the AFM cantilever. The analysis is based on a simple model of the cantilever moving in a…

材料科学 · 物理学 2008-10-20 Soma Das , P. A. Sreeram , A. K. Raychaudhuri

The effect of surface stress on the stiffness of cantilever beams remains an outstanding problem in the physical sciences. While numerous experimental studies report significant stiffness change due to surface stress, theoretical…

介观与纳米尺度物理 · 物理学 2012-11-05 Rassul B. Karabalin , L. G. Villanueva , M. H. Matheny , John E. Sader , Michael L. Roukes

We address the flutter instability of a flexible plate immersed in an axial flow. This instability is similar to flag flutter and results from the competition between destabilising pressure forces and stabilising bending stiffness. In…

流体动力学 · 物理学 2015-03-13 Christophe Eloy , Romain Lagrange , Claire Souilliez , Lionel Schouveiler

Atomic Force Microscopy (AFM) conventional static force curves and Force Feedback Microscopy (FFM) force curves acquired with the same cantilever at the solid/air and solid/liquid interfaces are here compared. The capability of the FFM to…

介观与纳米尺度物理 · 物理学 2013-06-13 Luca Costa , Mario S. Rodrigues , Simon Carpentier , Pieter Jan van Zwol , Joel Chevrier , Fabio Comin

In multifrequency atomic force microscopy higher eigenmodes are externally excited to enhance resolution and contrast while simultaneously increasing the number of experimental observables with the use of gentle forces. Here, the…

介观与纳米尺度物理 · 物理学 2014-07-14 Sergio Santos , Victor Barcons

We perform simulations and experiments on an oscillating atomic force microscope cantilever approaching a surface, where the intermodulation response of the cantilever driven with two pure harmonic tones is investigated. In the simulations,…

介观与纳米尺度物理 · 物理学 2013-02-25 Daniel Platz , Daniel Forchheimer , Erik A. Tholén , Carsten Hutter , David B. Haviland

Direct time-varying tip-sample force measurements by torsional harmonic cantilevers facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force microscopy. Here we report experimental evidence that the…

仪器与探测器 · 物理学 2008-11-26 Ozgur Sahin

In atomic force microscopy (AFM), the angle relative to the vertical ($\theta_{i}$) that the tip apex of a cantilever moves is determined by the tilt of the probe holder and the geometries of the cantilever and actuated eigenmode $i$. Even…

介观与纳米尺度物理 · 物理学 2017-08-01 Joseph L. Garrett , Lisa J. Krayer , Kevin J. Palm , Jeremy N. Munday

Atomic force microscopy cantilevers are often, intentionally or not, heated at their extremity. We describe a model to compute the resulting temperature field in the cantilever and in the surrounding fluid on a wide temperature range. In…

统计力学 · 物理学 2021-10-08 Basile Pottier , Ludovic Bellon

This work is a theoretical investigation of the stability of the non-linear behavior of an oscillating tip-cantilever system used in dynamic force microscopy. Stability criterions are derived that may help to a better understanding of the…

原子与分子团簇 · 物理学 2016-08-16 Laurent Nony , Rodolphe Boisgard , Jean-Pierre Aimé

This paper is a theoretical and a numerical investigation of the stability of a tip-cantilever system used in Non-Contact Atomic Force Microscopy (NC-AFM) when it oscillates close to a surface. No additional dissipative force is considered.…

原子与分子团簇 · 物理学 2016-08-16 Gérard Couturier , Laurent Nony , Rodolphe Boisgard , Jean-Pierre Aimé

In the experiments on stress-induced phase transitions in SMA strips, several interesting instability phenomena have been observed, including a necking-type instability, a shear-type instability and an orientation instability. By using the…

经典物理 · 物理学 2009-10-15 Hui-Hui Dai , Zongxi Cai

We consider a generic optomechanical system, consisting of a driven optical cavity and a movable mirror attached to a cantilever. Systems of this kind (and analogues) have been realized in many recent experiments. It is well known that…

介观与纳米尺度物理 · 物理学 2009-11-13 Max Ludwig , Björn Kubala , Florian Marquardt

Electrostatic force microscopy at cryogenic temperatures was used to probe the electrostatic interaction between a conductive atomic force microscopy tip and electronic charges trapped in an InAs quantum dot. Measurement of the…

凝聚态物理 · 物理学 2016-08-16 Aykutlu Dâna , Charles Santori , Yoshihisa Yamamoto

Using a thermodynamic approach based upon the fluctuation-dissipation theorem we quantify the stochastic dynamics of rectangular and V-shaped microscale cantilevers immersed in a viscous fluid. We show that the stochastic cantilever…

介观与纳米尺度物理 · 物理学 2009-11-13 M. T. Clark , M. R. Paul

In this $\ll$ contribution we address the question to what extent surface charges affect contact-mode scanning force microscopy measurements. % We therefore designed samples where we could generate localized electric field distributions…

材料科学 · 物理学 2016-08-14 F. Johann , Á. Hoffmann , E. Soergel

This paper is a theoretical and a numerical investigation of the stability of a tip-cantilever system used in noncontact atomic force microscopy (NC-AFM) when it oscillates close to a surface. No additional dissipative force is considered.…

原子与分子团簇 · 物理学 2016-08-16 Gérard Couturier , Laurent Nony , Rodolphe Boisgard , Jean-Pierre Aimé

The effect of strong anisotropy on the Fermi line of a system of correlated electrons is studied in two space dimensions, using renormalization group techniques. Inflection points change the scaling exponents of the couplings, enhancing the…

强关联电子 · 物理学 2009-10-30 J. Gonzalez , F. Guinea , M. A. H. Vozmediano

The application of variational principles for analyzing problems in the physical sciences is widespread. Cantilever-like problems, where one end is fixed and the other end is free, have received less attention in terms of their stability…

软凝聚态物质 · 物理学 2025-05-01 Siva Prasad Chakri Dhanakoti

A common use for atomic force microscopy is to quantify local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements depends on the accuracy to which the cantilever spring…

介观与纳米尺度物理 · 物理学 2021-12-08 Aaron Mascaro , Yoichi Miyahara , Omur E. Dagdeviren , Peter Grutter
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