相关论文: Virtual Sensor Based Fault Detection and Classific…

How can we identify problematic upstream processes when a certain type of wafer defect starts appearing at a quality checkpoint? Given the complexity of modern semiconductor manufacturing, which involves thousands of process steps,…

Compared with traditional model-based fault detection and classification (FDC) methods, deep neural networks (DNN) prove to be effective for the aerospace sensors FDC problems. However, time being consumed in training the DNN is excessive,…

Smart manufacturing systems are being deployed at a growing rate because of their ability to interpret a wide variety of sensed information and act on the knowledge gleaned from system observations. In many cases, the principal goal of the…

A fault diagnosis method for power electronics converters based on deep feedforward network and wavelet compression is proposed in this paper. The transient historical data after wavelet compression are used to realize the training of fault…

Fault diagnosis is the problem of determining a set of faulty system components that explain discrepancies between observed and expected behavior. Due to the intrinsic relation between observations and sensors placed on a system, sensors'…

Modern industrial facilities generate large volumes of raw sensor data during the production process. This data is used to monitor and control the processes and can be analyzed to detect and predict process abnormalities. Typically, the…

Predicting faults before they occur helps to avoid potential safety hazards. Furthermore, planning the required maintenance actions in advance reduces operation costs. In this article, the focus is on electrochemical cells. In order to…

Automated visual inspection in the semiconductor industry aims to detect and classify manufacturing defects utilizing modern image processing techniques. While an earliest possible detection of defect patterns allows quality control and…

The modernization of existing and new nuclear power plants with digital instrumentation and control systems (DI&C) is a recent and highly trending topic. However, there lacks strong consensus on best-estimate reliability methodologies by…

Sensor networks aim at monitoring their surroundings for event detection and object tracking. But, due to failure, or death of sensors, false signal can be transmitted. In this paper, we consider the problems of distributed fault detection…

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial to find the root cause of the issue and further improving the yield in the wafer foundry. Mixed-type DPR is…

Real-time data processing of the next generation of experiments at FAIR requires reliable event reconstruction and thus depends heavily on in-situ calibration procedures. Previously, we developed a neural-network-based approach that…

In this paper we present EPIC, an efficient and effective predictor for IC manufacturing hotspots in deep sub-wavelength lithography. EPIC proposes a unified framework to combine different hotspot detection methods together, such as machine…

Directed Energy Deposition (DED) offers significant potential for manufacturing complex and multi-material parts. However, internal defects such as porosity and cracks can compromise mechanical properties and overall performance. This study…

In this review, automatic defect inspection algorithms that analyze Scanning Electron Microscopy (SEM) images for Semiconductor Manufacturing (SM) are identified, categorized, and discussed. This is a topic of critical importance for the SM…

The focus of this work is on Statistical Process Control (SPC) of a manufacturing process based on available measurements. Two important applications of SPC in industrial settings are fault detection and diagnosis (FDD). In this work a deep…

Additive manufacturing, particularly fused deposition modeling, is transforming modern production by enabling rapid prototyping and complex part fabrication. However, its layer-by-layer process remains vulnerable to faults such as nozzle…

This study presents a practical approach for early fault detection in industrial pump systems using real-world sensor data from a large-scale vertical centrifugal pump operating in a demanding marine environment. Five key operational…

In this paper, an actuator active fault-tolerant controller (FTC) is proposed for the voltage source converter (VSC) which interfaces a distributed energy resource (DER) to the power grid. The proposed active FTC includes two units:…

Ensuring the quality and reliability of Metal Additive Manufacturing (MAM) components is crucial, especially in the Laser Powder Bed Fusion (L-PBF) process, where melt pool defects such as keyhole, balling, and lack of fusion can…