EXO-200 实验中氙气纯度质谱分析
仪器与探测器
2015-05-30 v1 核实验
摘要
我们描述了基于质谱技术对 EXO-200 双贝塔衰变实验所用天然及浓缩氙气库存进行的纯度测量。通过引入液氮冷阱，谱仪的灵敏度提升了数个数量级，许多感兴趣的杂质种类可在十亿分之一或更优的水平上被检测到。我们利用该技术在探测器使用前、使用中及使用后对 EXO-200 的氙气进行了筛查，这些测量结果已被证明十分有用。这是冷阱质谱技术在运行中的物理实验上的首次应用。
引用
@article{arxiv.1109.1046,
title = {Xenon purity analysis for EXO-200 via mass spectrometry},
author = {A. Dobi and C. Hall and S. Slutsky and Y. -R. Yen and B. Aharmin and M. Auger and P. S. Barbeau and C. Benitez-Medina and M. Breidenbach and B. Cleveland and R. Conley and J. Cook and S. Cook and I. Counts and W. Craddock and T. Daniels and C. G. Davis and J. Davis and R. deVoe and M. Dixit and M. J. Dolinski and K. Donato and W. Fairbank and J. Farine and P. Fierlinger and D. Franco and G. Giroux and R. Gornea and K. Graham and G. Gratta and C. Green and C. Hagemann and K. Hall and D. Hallman and C. Hargrove and S. Herrin and M. Hughes and J. Hodgson and F. Juget and A. Karelin and L. J. Kaufman and A. Kuchenkov and K. Kumar and D. S. Leonard and G. Lutter and D. Mackay and R. MacLellan and M. Marino and B. Mong and M. Montero Díez and P. Morgan and A. R. Müller and R. Neilson and A. Odian and K. O'Sullivan and A. Piepke and A. Pocar and C. Y. Prescott and K. Pushkin and A. Rivas and E. Rollin and P. C. Rowson and A. Sabourov and D. Sinclair and K. Skarpaas and V. Stekhanov and V. Strickland and M. Swift and K. Twelker and J. -L. Vuilleumier and J. -M. Vuilleumier and M. Weber and U. Wichoski and J. Wodin and J. D. Wright and L. Yang},
journal= {arXiv preprint arXiv:1109.1046},
year = {2015}
}
备注
19 pages, 6 figures