石墨烯的透射氦离子显微镜
应用物理
2020-04-06 v1 介观与纳米尺度物理
摘要
我们将透射氦离子显微镜（HIM）与石墨烯支撑膜的透射电子显微镜（TEM）进行了比较。我们展示了点透射图案，并将其与材料中离子的散射与射程（SRIM）预测进行了对比，同时给出了基于积分相机强度的扫描 He 透射图像示例。我们还探讨了相干 HIM 散射的潜力。
引用
@article{arxiv.2004.01682,
title = {Transmission Helium Ion Microscopy of Graphene},
author = {Karen L. Kavanagh and Aleksei Bunevich and Mallikarjuna Rao Motapothula},
journal= {arXiv preprint arXiv:2004.01682},
year = {2020}
}
备注
Draft of a conference proceedings paper: Ion Beam Analysis 2019 - to be published in Nucleation Instruments and Methods in Physics Research. Section B, Beam interactions with materials and atoms