在单根纳米线异质结构中观测到的强热载流子效应
介观与纳米尺度物理
2019-09-18 v3
摘要
我们利用瞬态瑞利散射研究单根GaAsSb/InP纳米线异质结构中光激发热载流子的热化过程。通过比较未表现出显著热载流子效应的单根裸GaAsSb纳米线与核壳纳米线中的能量损失率，我们表明InP壳层的存在在低温下显著抑制了LO声子发射率，从而导致强热载流子效应。
引用
@article{arxiv.1810.12516,
title = {Strong Hot Carrier Effects Observed in a Single Nanowire Heterostructure},
author = {Iraj Abbasian Shojaei and Samuel Linser and Giriraj Jnawali and N. Wickramasuriya and Howard E. Jackson and Leigh M. Smith and Fariborz Kargar and Alexander A. Balandin and Xiaoming Yuan and Philip Caroff and H. Hoe Tan and Chennupati Jagadish},
journal= {arXiv preprint arXiv:1810.12516},
year = {2019}
}
备注
17 pages, 5 figures