Shot-noise statistics in diffusive conductors
介观与纳米尺度物理
2009-11-07 v1 强关联电子
摘要
We study the full probability distribution of the charge transmitted through a mesoscopic diffusive conductor during a measurement time T. We have considered a semi-classical model, with an exclusion principle in a discretized single-particle phase-space. In the large T limit, numerical simulations show a universal probability distribution which agrees very well with the quantum mechanical prediction of Lee, Levitov and Yakovets [PRB {51} 4079 (1995)] for the charge counting statistics. Special attention is given to its third cumulant, including an analysis of finite size effects and of some experimental constraints for its accurate measurement.
引用
@article{arxiv.cond-mat/0202149,
title = {Shot-noise statistics in diffusive conductors},
author = {P. -E. Roche and B. Doucot},
journal= {arXiv preprint arXiv:cond-mat/0202149},
year = {2009}
}
备注
Submitted to Eur. Phys. J. B (Jan. 2002)