全场透射X射线显微镜中的纳米尺度暗场成像
光学
2025-07-10 v3 仪器与探测器
摘要
暗场信号揭示了超越传统X射线衰减对比的细节，这对材料科学尤为宝贵。特别是，暗场技术能够揭示超出装置空间分辨率的结构。然而，其实现目前仍局限于微米尺度。因此，我们提出一种利用暗场信号来扩展全场透射X射线显微镜的技术。所提出的方法基于对光束整形聚光镜的明确照明，这允许在物镜的后焦面通过电动光阑阻挡明场。该方法实现简单，能够在保持短扫描时间的同时实现快速模态切换，从而使暗场成像在纳米尺度上得到广泛应用。
引用
@article{arxiv.2403.18884,
title = {Nanoscale Dark-Field Imaging in Full-Field Transmission X-Ray Microscopy},
author = {Sami Wirtensohn and Peng Qi and Christian David and Julia Herzen and Imke Greving and Silja Flenner},
journal= {arXiv preprint arXiv:2403.18884},
year = {2025}
}
备注
Updated version; revised according to the comments from the peer review. There were only minor changes. In general we mainly added more detailed explanations. We changed the title, extended sections 2.1., 2.2., 2.3. and 3., extended Fig. 1 to better illustrate the differences between the two imaging modes, and made some slight adjustments in section 4. for clarifications