Directional dark-field imaging is an emerging x-ray modality that is sensitive to unresolved anisotropic scattering from sub-pixel sample microstructures. A single-grid imaging set-up can be used to capture dark-field images by looking at changes in a grid pattern projected upon the sample. By creating analytical models for the experiment, we have developed a single-grid directional dark field retrieval algorithm that can extract dark-field parameters such as the dominant scattering direction, and the semi-major and -minor scattering angles. We show that this method is effective even in the presence of high image noise, allowing for low dose and time sequence imaging.
@article{arxiv.2211.11757,
title = {Directional dark-field retrieval with single-grid x-ray imaging},
author = {Michelle K Croughan and Ying Ying How and Allan Pennings and Kaye S Morgan},
journal= {arXiv preprint arXiv:2211.11757},
year = {2023}
}