Keck 阵列上的微波复用技术
天体物理仪器与方法
2020-01-22 v2
摘要
我们描述了在 Keck 阵列（一台在南极点观测宇宙微波背景的偏振实验）的一台接收机中进行的微波复用读出系统的上天空演示。在 2018-2019 年南极夏季期间，我们用微波复用组件替换了时分复用读出系统，这些组件包括耦合到亚开尔文焦平面上射频超导量子干涉器件的超导微波谐振器、室温与冷级之间的同轴电缆管路与放大设备，以及用于常温电子学的 SLAC 微谐振器射频系统。在 5-6 GHz 范围内，单根同轴电缆读出 528 个通道。该读出系统耦合到 transition-edge sensors（跃变边缘传感器），后者又耦合到 150-GHz 缝隙偶极子相控阵天线。观测于 2019 年 4 月开始，我们在此报告该系统的初步表征结果。
引用
@article{arxiv.1909.01305,
title = {Microwave multiplexing on the Keck Array},
author = {Ari Cukierman and Zeeshan Ahmed and Shawn Henderson and Edward Young and Cyndia Yu and Denis Barkats and David Brown and Saptarshi Chaudhuri and James Cornelison and John M. D'Ewart and Marion Dierickx and Bradley J. Dober and John Dusatko and Sofia Fatigoni and Jeff P. Filippini and Josef C. Frisch and Gunther Haller and Mark Halpern and Gene C. Hilton and Johannes Hubmayr and Kent D. Irwin and Kirit S. Karkare and Ethan Karpel and Sarah A. Kernasovskiy and John M. Kovac and Attila Kovacs and Stephen E. Kuenstner and Chao-Lin Kuo and Dale Li and John A. B. Mates and Stephen Smith and Tyler St. Germaine and Joel N. Ullom and Leila R. Vale and Daniel D. Van Winkle and Jesus Vasquez and Justin Willmert and Lingzhen Zeng and P. A. R. Ade and M. Amiri and R. Basu Thakur and C. A. Bischoff and J. J. Bock and H. Boenish and E. Bullock and V. Buza and J. Cheshire and J. Connors and M. Crumrine and L. Duband and G. Hall and S. Harrison and S. R. Hildebrandt and H. Hui and J. Kang and S. Kefeli and K. Lau and K. G. Megerian and L. Moncelsi and T. Namikawa and H. T. Nguyen and R. O'Brient and S. Palladino and C. Pryke and B. Racine and C. D. Reintsema and S. Richter and A. Schillaci and R. Schwarz and C. D. Sheehy and A. Soliman and B. Steinbach and R. V. Sudiwala and K. L. Thompson and C. Tucker and A. D. Turner and C. Umilta and A. G. Vieregg and A. Wandui and A. C. Weber and D. V. Wiebe and W. L. K. Wu and H. Yang and K. W. Yoon and C. Zhang},
journal= {arXiv preprint arXiv:1909.01305},
year = {2020}
}
备注
9 pages, 11 figures, Accepted by the Journal of Low Temperature Physics (Proceedings of the 18th International Workshop on Low Temperature Detectors)