中文

Low-temperature dephasing in disordered conductors: experimental aspects

介观与纳米尺度物理 2017-09-27 v1

摘要

What is the lowest temperature to which one can trace the growth of the dephasing time in low-dimensional conductors? I consider the fundamental limitation, the crossover from weak to strong localization, as well as several experimental reasons for frequently observed saturation of the dephasing time (hot-electron effects, dephasing by external noise). Recent progress in our understanding of the electron-phonon interaction in disordered conductors is also briefly discussed.

关键词

引用

@article{arxiv.cond-mat/9908099,
  title  = {Low-temperature dephasing in disordered conductors: experimental aspects},
  author = {Michael Gershenson},
  journal= {arXiv preprint arXiv:cond-mat/9908099},
  year   = {2017}
}

备注

10 pages, 5 figures, uses annalen.cls, presented at Localization-99, to be published in Annalen der Physik