通过 X 射线光学、扫描隧道和透射电子显微镜研究量子维度结构参数
材料科学
2013-07-09 v1 介观与纳米尺度物理
光学
摘要
介绍了双波长 X 射线反射法在具有密集堆叠 Ge 量子点链的 Ge/Si(001) 异质结构探索中的应用。
引用
@article{arxiv.1304.0955,
title = {Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy},
author = {A. G. Touryanski and V. M. Senkov and S. S. Gizha and L. V. Arapkina and V. A. Chapnin and K. V. Chizh and V. P. Kalinushkin and M. S. Storozhevykh and O. V. Uvarov and V. A. Yuryev},
journal= {arXiv preprint arXiv:1304.0955},
year = {2013}
}
备注
21st Int. Symp. "Nanostructures: Physics and Technology"; Saint Petersburg, Russia, June 24-28, 2013