利用透射电子显微镜对MgB2中磁通涡旋的成像
超导电性
2015-05-30 v3
摘要
我们报告了利用透射电子显微镜成功对单晶MgB2中磁通涡旋进行成像的结果。样品通过聚焦离子束减薄至电子透明（厚度350纳米）。减薄过程的一个伪影是样品中产生了高度为1-2纳米的纵向厚度起伏，这些起伏由于涡旋穿越所需的能量而充当钉扎中心。这对我们在此研究的涡旋有序图案产生了深远影响。补充信息可从http://www-hrem.msm.cam.ac.uk/people/loudon/#publications下载。
引用
@article{arxiv.1109.1969,
title = {Imaging Flux Vortices in MgB2 using Transmission Electron Microscopy},
author = {J. C. Loudon and C. J. Bowell and N. D. Zhigadlo and J. Karpinski and P. A. Midgley},
journal= {arXiv preprint arXiv:1109.1969},
year = {2015}
}
备注
3 pages, 2 figures to appear in Physica C. Supplementary information can be downloaded from http://www-hrem.msm.cam.ac.uk/people/loudon/#publications. The discussion of the vortex-free region near the sample edge has been revised in response to referees' comments. Changes have been made to clarify that the specimen thickness is 250nm parallel to the c-axis but 350nm parallel to the electron beam