Double-tip STM for Surface Analysis
凝聚态物理
2008-02-03 v2
摘要
We explore the possibility of using a double-tip STM to probe the single electron Green function of a sample surface, and describe a few important applications: (1) Probing constant energy surfaces in -space by ballistic transport; (2) Measuring scattering phase shifts of defects; (3) Observing the transition from ballistic to diffusive transport to localization; and (4) Measuring inelastic mean free paths.
关键词
引用
@article{arxiv.cond-mat/9405036,
title = {Double-tip STM for Surface Analysis},
author = {Q. Niu and M. C. Chang and C. K. Shih},
journal= {arXiv preprint arXiv:cond-mat/9405036},
year = {2008}
}
备注
Minor changes, to appear in Phys.Rev.B, 12 pages + 2 figures