利用低成本 BIST 进行噪声系数评估
其他计算机科学
2011-11-09 v1
摘要
本文描述了一种适用于内建自测试 (BIST) 实现的噪声系数评估技术。该技术基于一种低成本单比特数字化仪，能够同时对模拟电路中的多个测试点进行噪声系数评估。该方法还能利用片上系统 (SoC) 的资源，如存储器和处理能力。文中展示了理论背景和实验结果，以证明该方法的可行性。
引用
@article{arxiv.0710.4718,
title = {Noise Figure Evaluation Using Low Cost BIST},
author = {Marcelo Negreiros and Luigi Carro and Altamiro A. Susin},
journal= {arXiv preprint arXiv:0710.4718},
year = {2011}
}
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