中文

通过交流磁化率测量分析薄膜中的临界态响应

超导电性 2009-11-13 v1

摘要

对 Nb 薄膜非线性交流磁化率温度依赖性的谐波分析,与基于二维圆盘滞后临界态模型计算出的磁化率吻合极好。

关键词

引用

@article{arxiv.0710.3891,
  title  = {Analysis of Critical State Response in Thin Films by ac Susceptibility Measurements},
  author = {A. Youssef and Z. Svindrych and J. Hadac and Z. Janu},
  journal= {arXiv preprint arXiv:0710.3891},
  year   = {2009}
}

备注

4 pages, 4 figures, MT20 conference, accepted for IEEE Trans. Appl. Supercond