低温辐射热计探测器读出电路中电子噪声的解析模型
仪器与探测器
2022-12-07 v3
摘要
本文提出一种解析模型，用于量化低温辐射热计读出电路中测得的噪声。该模型包含偏置电阻与传感器电阻、放大器的电压与电流噪声以及电缆电容的贡献。利用自主研制的中子嬗变掺杂（NTD）Ge传感器的实测噪声数据的频域分析，对模型参数进行经验估计。结果表明，该模型可描述对应于 20–70 mK 温度范围内不同阻值的 NTD Ge 传感器的噪声数据。讨论了各组件的相对贡献，表明 300 K 下差分放大器对总体噪声的贡献是主导来源。观察到放大器的闪烁噪声显著低于放大器数据手册中所给出的值。本研究还指出，从噪声角度考虑，NTD 传感器的期望阻值（R）在 20 mK 时应为 1 G。
引用
@article{arxiv.2103.13593,
title = {An analytical model for electronic noise in a cryogenic bolometer detector readout circuit},
author = {V. Vatsa and A. Reza and A. Mazumdar and M. S. Pose and S. Mallikarjunachary and V. Nanal and R. G. Pillay and S. Ramakrishnan and A. Shrivastava},
journal= {arXiv preprint arXiv:2103.13593},
year = {2022}
}
备注
Replaced the existing time domain analysis with frequency domain analysis as that is a better representation of noise data. The older manuscript included work done on NTD Ge sensors only, while the replacement manuscript has work done on NTD and SMD sensors both with the results verifed over a wider range of resistance for NTD Ge sensors