Cluster Imaging with a Direct Detection CMOS Pixel Sensor in Transmission Electron Microscopy

Marco Battaglia; Devis Contarato; Peter Denes; Piero Giubilato

doi:10.1016/j.nima.2009.07.017

Cluster Imaging with a Direct Detection CMOS Pixel Sensor in Transmission Electron Microscopy

Instrumentation and Detectors 2009-10-29 v1

Authors: Marco Battaglia , Devis Contarato , Peter Denes , Piero Giubilato

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Abstract

A cluster imaging technique for Transmission Electron Microscopy with a direct detection CMOS pixel sensor is presented. Charge centre-of-gravity reconstruction for individual electron clusters improves the spatial resolution and thus the point spread function. Data collected with a CMOS sensor with 9.5 micron pixels show an improvement of a factor of two in point spread function to 2.7 micron at 300 keV and of a factor of three in the image contrast, compared to traditional bright field illumination.

Keywords

optical microscopy and spectroscopy particle detector x-ray imaging and diffraction

Cite

@article{arxiv.0907.3809,
  title  = {Cluster Imaging with a Direct Detection CMOS Pixel Sensor in Transmission Electron Microscopy},
  author = {Marco Battaglia and Devis Contarato and Peter Denes and Piero Giubilato},
  journal= {arXiv preprint arXiv:0907.3809},
  year   = {2009}
}

Comments

6 pages, 3 figures, submitted to Nucl. Instr. Meth. A

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