Application of SOI Area Detectors to Synchrotron Radiation X-ray Experiments

Ryo Hashimoto; Noriyuki Igarashi; Reiji Kumai; Shunji Kishimoto

Application of SOI Area Detectors to Synchrotron Radiation X-ray Experiments

Instrumentation and Detectors 2015-07-29 v1

Authors: Ryo Hashimoto , Noriyuki Igarashi , Reiji Kumai , Shunji Kishimoto

Abstract

Application of new detectors using Silicon-On-Insulator (SOI) technology has been started in the Photon Factory, KEK. This project has two purposes. The first purpose is to develop a pulse-counting-type X-ray detector which can be used in synchrotron soft X-ray experiments. The second one is to apply the SOI area detector developed by RIKEN, SOPHIAS, to X-ray diffraction and small-angle scattering experiments in Photon Factory. In this paper, we introduce the current status of our project.

Keywords

SOI technology area detector synchrotron radiation X-ray experiments pulse-counting detector X-ray diffraction small-angle scattering

Cite

@article{arxiv.1507.07732,
  title  = {Application of SOI Area Detectors to Synchrotron Radiation X-ray Experiments},
  author = {Ryo Hashimoto and Noriyuki Igarashi and Reiji Kumai and Shunji Kishimoto},
  journal= {arXiv preprint arXiv:1507.07732},
  year   = {2015}
}

Comments

Proceedings of International Workshop on SOI Pixel Detector (SOIPIX2015), Tohoku University, Sendai, Japan, 3-6, June, 2015. C15-06-03

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