English

A SOI-Based Low Noise and Wide Dynamic Range Event-Driven Detector for X-Ray Imaging

Instrumentation and Detectors 2015-07-27 v1

Abstract

A low noise and wide dynamic range event driven detector for the detection of X-Ray energy is realized using 0.2 [um] Silicon on insulator (SOI) technology. Pixel circuits are divided into two parts; signal sensing circuit and event detection circuit. Event detection circuit is activated when X-Ray energy falls into the detector. In-pixel gain selection is implemented for the detection of a small signal and wide band of energy particle. Adaptive gain and capability of correlated double sampling (CDS) technique for the kTC noise canceling of charge detector realizes the low noise and high dynamic range event driven detector.

Keywords

Cite

@article{arxiv.1507.06747,
  title  = {A SOI-Based Low Noise and Wide Dynamic Range Event-Driven Detector for X-Ray Imaging},
  author = {Sumeet Shrestha and Hiroki Kamehama and Shoji Kawahito and Keita Yasutomi and Keiichiro Kagawa and Ayaki Takeda and Takeshi Go Tsuru and Yasuo Arai},
  journal= {arXiv preprint arXiv:1507.06747},
  year   = {2015}
}

Comments

6 pages, 8 figures

R2 v1 2026-06-22T10:17:39.472Z