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Strong coupling between electrical and mechanical phenomena and the presence of switchable polarization have enabled applications of ferroelectric materials for nonvolatile memories (FeRAM), data storage, and ferroelectric lithography.…

Scanning Probe Microscopy (SPM) is the primary tool for exploring nanoscale functionality, yet standard single-frequency operation is fundamentally limited, because the dynamic tip-sample interaction is mathematically underdetermined. While…

Nonlinear metasurfaces that dynamically manipulate the phase of a passing light beam are of interest for a wide range of applications. The controlled operation of such devices requires accurate measurements of the optical transmission phase…

A two-step detection strategy is suggested for the precise measurement of the optical phase-shift. In the first step an unsharp, however, unbiased joint measurement of the phase and photon number is performed by heterodyning the signal…

量子物理 · 物理学 2009-10-31 A. V. Chizhov , V. De Renzi , M. G. A. Paris

Optomechanical transduction is demonstrated for nanoscale torsional resonators evanescently coupled to optical microdisk whispering gallery mode resonators. The on-chip, integrated devices are measured using a fully fiber-based system,…

介观与纳米尺度物理 · 物理学 2013-05-14 P. H. Kim , C. Doolin , B. D. Hauer , A. J. R. MacDonald , M. R. Freeman , P. E. Barclay , J. P. Davis

Radio-frequency reflectometry of nanodevices requires careful separation of signal quadratures to distinguish dissipative and dispersive contributions to the device impedance. A tunable phase shifter for this purpose is described and…

仪器与探测器 · 物理学 2014-12-16 G. Yin , G. A. D. Briggs , E. A. Laird

A method of distributed calibration of a probe microscope scanner is suggested which main idea consists in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface, whereby…

材料科学 · 物理学 2016-05-19 Rostislav V. Lapshin

During the dielectric breakdown process of thin solid-state nanopores, the application of high voltages may cause the formation of multi-nanopores on one chip, which number and sizes are important for their applications. Here, simulations…

化学物理 · 物理学 2024-10-30 Yinghua Qiu , Long Ma , Zhe Liu , Hongwen Zhang , Bowen Ai , Xinman Tu

Dissipative and dispersive optomechanical couplings are experimentally observed in a photonic crystal split-beam nanocavity optimized for detecting nanoscale sources of torque. Dissipative coupling of up to approximately $500$ MHz/nm and…

Ptychography has become prominent at synchrotron facilities worldwide for characterizing biological and material specimens' topological structures and properties at the nanometer or atomic scale, due to its lens - less, highly quantitative…

图像与视频处理 · 电气工程与系统科学 2025-01-28 Tao Liu , Bingyang Wang , JiangTao Zhao , Maik Kahnt , Fucai Zhang

Investigation of transport properties is fundamental for characterizing electronic properties and phase transitions. However, most of the transport measurements on conductive layers have been performed at macroscopic scales, and thus the…

介观与纳米尺度物理 · 物理学 2025-06-25 Masayuki Hamada , Masahiro Haze , Junya Okazaki , Yukio Hasegawa

In this paper, the authors propose a two-dimensional, wide dynamic range, linear displacement sensor using microwave methods. The microwave sensor circuit employs a cylindrical dielectric resonator proximity coupled to a pair of orthogonal…

应用物理 · 物理学 2023-02-28 Premsai Regalla , A. V. Praveen Kumar

A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process the dynamic motion of the cantilever can be adjusted to…

A novel device that can be used as a tunable support-free phase plate for transmission electron microscopy of weakly scattering specimens is described. The device relies on the generation of a controlled phase shift by the magnetic field of…

Multi-tip scanning tunneling microscopy (STM) is a powerful method to perform charge transport measurements at the nanoscale. With four STM tips positioned on the surface of a sample, four-point resistance measurements can be performed in…

介观与纳米尺度物理 · 物理学 2022-01-28 A. Leis , V. Cherepanov , B. Voigtländer , F. S. Tautz

Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a…

材料科学 · 物理学 2009-11-10 Aykutlu Dana , Yoshihisa Yamamoto

Molecular dynamics simulations have been performed to understand true atomic resolution, which has been observed on the Si(111)-7$\times$7 surface by dynamic force microscopy in ultra high vacuum(UHV). Stable atomic-scale contrast is…

材料科学 · 物理学 2009-10-31 Abduxukur Abdurixit , Alexis Baratoff , Ernest Meyer

The monitoring of accelerations is essential for a variety of applications ranging from inertial navigation to consumer electronics. The basic operation principle of an accelerometer is to measure the displacement of a flexibly mounted test…

The reliable operation of micro and nanomechanical devices necessitates a thorough knowledge of the water film thickness present on the surfaces of these devices with an accuracy in the nm range. In this work, the thickness of an ultra-thin…

材料科学 · 物理学 2007-05-23 A. Opitz , M. Scherge , S. I. -U. Ahmed , J. A. Schaefer

The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…