相关论文: Single-loop interferometer for minimal ellipsometr…
Spectroscopic ellipsometry is a potent method that is widely adopted for the measurement of thin film thickness and refractive index. However, a conventional ellipsometer, which utilizes a mechanically rotating polarizer and grating-based…
We experimentally demonstrate that the spectral sensitivity of a Mach-Zehnder (MZ) interferometer can be enhanced through structural slow light. We observe a 20 times enhancement by placing a dispersion-engineered-slow-light…
Imaging polarimetry plays an essential role in various fields since it imparts rich information that cannot be obtained through mere intensity and spectral measurements. To retrieve full Stokes parameters, at least four sensor pixels are…
The best performance of a Mach-Zehnder interferometer is achieved with the input state |N_T/2 + 1>|N_T/2-1 > + |N_T/2 - 1>|N_T/2+1>, being N_T the total number of atoms/photons. This gives: i) a phase-shift error confidence C_{68%}=2.67/N_T…
The Mach-Zehnder interferometric setup quantitatively characterizing the wave-particle duality implements in fact a joint measurement of two unsharp observables. We present a necessary and sufficient condition for such a pair of unsharp…
Using a scheme based on a Mach-Zehnder interferometer, we propose an analysis of the superposition of polarized laser beams at a given angle. The focus of our study is the spatially varying polarization state of the resulting field, also…
The growing use of ultrashort laser pulses exhibiting time-varying polarization (vector pulses) demands simple and robust characterization techniques capable to perform measurements in a broad range of experimental and environmental…
We report a multiple-loop guided atom interferometer in which the atoms make 200 small-amplitude roundtrips, instead of one large single orbit. The approach is enabled by using ultracold 39K gas and a magnetic Feshbach resonance that can…
The Mach-Zehnder interferometer is a fundamental tool for measuring phase shifts between two light paths, serving as a crucial prototype for achieving high-precision measurements in various scientific and technological applications. In this…
We report a nonlocal interferometer capable of detecting entanglement and identifying Bell states statistically. This is possible due to the interferometer's unique correlation dependence on the anti-diagonal elements of the density matrix,…
Mueller matrices provide a complete description of a medium's response to excitation by polarized light, and their characterization is important across a broad range of applications from ellipsometry in material science to polarimetry in…
We demonstrate for the first time flat-top interleavers based on cascaded Mach-Zehnder interferometers (MZIs) which use only single multimode interferometers (MMIs) as power splitters. Our previous designs were based on 4-stage cascades of…
A novel approach for measuring linear X-ray polarization over a broad-band using conventional imaging optics and cameras is described. A new type of high efficiency grating, called the critical angle transmission grating is used to disperse…
The polarization state of light is a key parameter in many imaging systems. For example, it can image mechanical stress and other physical properties that are not seen with conventional imaging, and can also play a central role in quantum…
We report on the generation of polarization squeezing of intense, short light pulses using an asymmetric fiber Sagnac interferometer. The Kerr nonlinearity of the fiber is exploited to produce independent amplitude squeezed pulses. The…
Stokes polarimetry has been considered as an alluring platform that enables a plethora of applications ranging from single-molecule orientation to deep-space sensing. Existing polarimetry avenues, however, rely primarily on the transversely…
Measuring light's state of polarization is an inherently difficult problem, since the phase information between orthogonal polarization states is typically lost in the detection process. In this work, we bring to the fore the equivalence…
Ellipsometry is a technique whereby the measurement of the two orthogonal polarization components of light reflected at glancing incidence allows a characterization of the optical properties of a material at a particular frequency.…
We present a simple but powerful technique for the analysis of polarized emission from radio galaxies and other objects. It is based on the fact that images of Stokes parameters often contain considerably more information than is available…
We present here a new parametric resonance magnetometer scheme based on elliptically polarized pumping light and two radio-frequency fields applied along the two optical pumping directions. At optimum ellipticity and radio-frequency fields…