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相关论文: Polarization Measurements - A Numerical Approach

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Ellipsometry techniques allow to measure polarization information of materials, requiring precise rotations of optical components with different configurations of lights and sensors. This results in cumbersome capture devices, carefully…

图形学 · 计算机科学 2023-02-09 Inseung Hwang , Daniel S. Jeon , Adolfo Muñoz , Diego Gutierrez , Xin Tong , Min H. Kim

We report on a novel and efficient source of polarization squeezing using a single pass through an optical fiber. Simply passing this Kerr squeezed beam through a carefully aligned lambda/2 waveplate and splitting it on a polarization beam…

量子物理 · 物理学 2009-11-10 J. Heersink , V. Josse , G. Leuchs , U. L. Andersen

I propose a new optoelectronic device that completely and instantaneously measures the incident light's polarization for a narrow wavelength band in a single physical pixel. The device has four (or more) quantum-well active regions…

仪器与探测器 · 物理学 2007-05-23 Mario Serna

Using polarization measurements in remote sensing and optical studies allows retrieving more information. We consider relationship between the reflection coefficients of plane and rough surfaces for linearly polarized waves. Certain…

光学 · 物理学 2012-12-14 Yu. K. Shestopaloff

We describe a method for precise estimation of the polarization of a mesoscopic spin ensemble by using its coupling to a single two-level system. Our approach requires a minimal number of measurements on the two-level system for a given…

量子物理 · 物理学 2009-11-11 G. Giedke , J. M. Taylor , D. D'Alessandro , M. D. Lukin , A. Imamoglu

Quantifying the amount of polarization is crucial for understanding and studying political polarization in political and social systems. Several methods are used commonly to measure polarization in social networks by purely inspecting their…

社会与信息网络 · 计算机科学 2022-04-14 Ali Salloum , Ted Hsuan Yun Chen , Mikko Kivelä

In this paper we present a differential approach to photo-polarimetric shape estimation. We propose several alternative differential constraints based on polarisation and photometric shading information and show how to express them in a…

计算机视觉与模式识别 · 计算机科学 2017-08-28 Silvia Tozza , William A. P. Smith , Dizhong Zhu , Ravi Ramamoorthi , Edwin R. Hancock

A simple, self-calibrating, rotating-waveplate polarimeter is largely insensitive to light intensity fluctuations and is shown to be useful for determining the Stokes parameters of light. This study shows how to minimize the in situ…

光学 · 物理学 2021-11-16 Vitaly Wirthl , Cristian D. Panda , Paul W. Hess , Gerald Gabrielse

A detailed and formal account of polarization measurements using Bayesian analysis is given based on the assumption of gaussian error for the Stokes parameters. This analysis is crucial for the measurement of the polarization degree and…

天体物理仪器与方法 · 物理学 2015-06-04 Jason L. Quinn

A number of polarization estimators have been developed for a variety of astrophysical applications to compensate measurements of linear polarization for a bias contributed by the instrumental noise. Most derivations of the estimators…

高能天体物理现象 · 物理学 2025-03-11 M. M. McKinnon

Ellipsometry is a powerful and well-established optical technique used in the characterisation of materials. It works by combining the components of elliptically polarized light in order to draw information about the optical system. We…

光学 · 物理学 2018-03-15 Manoel P. Araújo , Stefano De Leo , Gabriel G. Maia

In this chapter we present a brief summary of methods, instruments and calibration techniques used in modern astronomical polarimetry in the optical wavelengths. We describe the properties of various polarization devices and detectors used…

天体物理仪器与方法 · 物理学 2019-08-29 Andrei Berdyugin , Vilppu Piirola , Juri Poutanen

We present experimental results on a method to perform polarimetry on ensembles of single photons. Our setup is based on a measurement method known to be optimal for estimating the state of two level systems. The setup has no moving parts…

量子物理 · 物理学 2009-11-11 Alexander Ling , Soh Kee Pang , Antia Lamas-Linares , Christian Kurtsiefer

Performing reliable measurements in optical metrology, such as those needed in ellipsometry, requires a calibrated source and detector, or a well-characterized reference sample. We present a novel interferometric technique to perform…

The problem of imaging materials with circular polarization properties is discussed within the framework of vectorial ptychography. We demonstrate, both theoretically and numerically, that using linear polarizations to investigate such…

光学 · 物理学 2023-10-04 Patrick Ferrand , Michel Mitov

We propose a novel approach to measure spin polarization of nucleons produced in electron--positron collisions. Using existing tracking devices and supporting structure material, general-purpose spectrometers can be utilized as a…

高能物理 - 唯象学 · 物理学 2025-01-07 Yu-Tie Liang , Xiao-Rong Lv , Andrzej Kupsc , Boxing Gou , Hai-Bo Li

High precision polarization measurements open new opportunities for the study of the magnetic field structure as traced by polarimetric measurements of the interstellar dust emission. Polarization parameters suffer from bias in the presence…

星系天体物理 · 物理学 2017-03-15 D. Alina , L. Montier , I. Ristorcelli , J. -P. Bernard , F. Levrier , E. Abdikamalov

A method for photon linear polarization determination based on the measurement of the asymmetry of pairs produced by polarized photons in single crystals within the optimal intervals of pair particles energies is proposed. In difference to…

高能物理 - 实验 · 物理学 2009-10-31 A. B. Apyan , R. O. Avakian , S. M. Darbinian , K. A. Ispirian , S. P. Taroian

Taking advantage of the advances in array detector technology, an imaging polarimeter (IMPOL) has been constructed for measuring linear polarization in the wavelength band from 400-800 nm. It makes use of a Wollaston prism as the analyser…

天体物理学 · 物理学 2009-09-15 A. N. Ramaprakash , Ranjan Gupta , A. K. Sen , S. N. Tandon

An ellipsometer is a vital precision tool used for measuring optical parameters with wide applications in many fields, including accurate measurements in film thickness, optical constants, structural profiles, etc. However, the precise…