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The adequate interpretation of scanning tunneling microscopy (STM) images of the clean Si(001) surface is presented. We have performed both STM observations and {\it ab initio} simulations of STM images for buckled dimers on the clean…

材料科学 · 物理学 2009-10-31 H. Okada , Y. Fujimoto , K. Endo , K. Hirose , Y. Mori

A first principles theory of inelastic tunneling between a model probe tip and an atom adsorbed on a surface is presented, extending the elastic tunneling theory of Tersoff and Hamann. The inelastic current is proportional to the change in…

材料科学 · 物理学 2009-10-31 K. Stokbro , Ben Yu-Kuang Hu , C. Thirstrup , X. C. Xie

Scanning tunneling microscopy images of hydrogen-terminated Si(110) surfaces are studied using first-principles calculations. Our results show that the calculated filled-state images and local density of states are consistent with recent…

材料科学 · 物理学 2009-11-11 Shinya Horie , Kenta Arima , Kikuji Hirose , Jun Katoh , Tomoya Ono , Katsuyoshi Endo

We introduce a novel control mode for Scanning Tunneling Microscopy (STM) that leverages di/dz feedback. By superimposing a high-frequency sinusoidal modulation on the control signal, we extract the amplitude of the resulting tunneling…

系统与控制 · 电气工程与系统科学 2024-12-10 Richa Mishra , S. O. Reza Moheimani

Based on Bardeen's perturbative approach to tunneling, we have found an expression for the current between tip and sample, which can be efficiently coded in order to perform fast ab initio simulations of STM images. Under the observation…

材料科学 · 物理学 2007-05-23 Oscar Paz , Jose M. Soler

We describe a first principles method to calculate scanning tunneling microscopy (STM) images, and compare the results to well-characterized experiments combining STM with atomic force microscopy (AFM). The theory is based on density…

介观与纳米尺度物理 · 物理学 2018-09-14 Alexander Gustafsson , Norio Okabayashi , Angelo Peronio , Franz J. Giessibl , Magnus Paulsson

In a Scanning Tunneling Microscope (STM), when a tunneling electron treated as a point charge enters the barrier region between the tip and the sample, it induces image charges on the conducting surfaces, which modifies the shape of the…

其他凝聚态物理 · 物理学 2026-05-15 Malati Dessai , Arun V. Kulkarni

We present a very efficient and accurate method to simulate scanning tunneling microscopy images and spectra from first-principles density functional calculations. The wave-functions of the tip and sample are calculated separately on the…

材料科学 · 物理学 2016-08-16 Óscar Paz , Iván Brihuega , José M. Gómez-Rodríguez , José M. Soler

Scanning Tunneling Microscopy (STM) has revolutionized our atomic scale understanding of surfaces and accelerated progress in nanotechnology. This technique, however, is restricted to metal or semiconducting samples, as it requires a tiny…

仪器与探测器 · 物理学 2026-04-16 M. J. Rost

It has been a long-standing puzzle why buckled dimers of the Si(001) surface appeared symmetric below 20 K in scanning tunneling microscopy (STM) experiments. Although such symmetric dimer images were concluded to be due to an artifact…

材料科学 · 物理学 2016-08-17 Xiao-Yan Ren , Hyun-Jung Kim , Chun-Yao Niu , Yu Jia , Jun-Hyung Cho

Crystallographic image processing (CIP) techniques may be utilized in scanning probe microscopy (SPM) to glean information that has been obscured by signals from multiple probe tips. This may be of particular importance for scanning…

材料科学 · 物理学 2020-07-07 Jack C. Straton , Peter Moeck , Bill Moon , Taylor T. Bilyeu

A Scanning Tunneling Microscope (STM) is one of the most important scanning probe tools available to study and manipulate matter at the nanoscale. In a STM, a tip is scanned on top of a surface with a separation of a few \AA. Often, the…

We report on the first principles determination of the conductance properties of Buckminster fullerene adsorbed on a gold surface, comparing them with recent Scanning Tunneling Microscopy/Spectroscopy (STM/S) experiments [J.Chem.Phys.116,…

材料科学 · 物理学 2007-05-23 A. J. Perez-Jimenez , J. J. Palacios , E. Louis , E. SanFabian , J. A. Verges

Explicit predictions for Scanning Tunneling Microscopy (STM) on interacting one-dimensional electron systems are made using the Luttinger liquid formalism. The STM current changes with distance from an impurity or boundary in a…

强关联电子 · 物理学 2009-10-31 Sebastian Eggert

We use scanning tunneling microscopy (STM) and Auger electron spectroscopy to study the behavior of adsorbed phosphine (PH$_{3}$) on Si(001), as a function of annealing temperature, paying particular attention to the formation of the Si-P…

材料科学 · 物理学 2007-05-23 N. J. Curson , S. R. Schofield , M. Y. Simmons , L. Oberbeck , J. L. O'Brien , R. G. Clark

We theoretically investigate spin-polarized transport in a system composed of a ferromagnetic Scanning Tunneling Microscope (STM) tip coupled to an adsorbed atom (adatom) on a host surface. Electrons can tunnel directly from the tip to the…

介观与纳米尺度物理 · 物理学 2011-09-21 P. H. Penteado , F. M. Souza , A. C. Seridonio , E. Vernek , J. C. Egues

Scanning tunneling microscopy using a CO-functionalized tip is combined with simulations to explore the impact of the CO tilt angle on topographies of a single Cu atom and CO molecule adsorbed on Cu(111). Images of the Cu atom acquired with…

材料科学 · 物理学 2024-09-24 Ivan Abilio , Nicolas Néel , Jörg Kröger , Krisztián Palotás

A comprehensive theory is presented for the voltage, temperature, and spatial dependence of the tunneling current between a scanning tunneling microscope (STM) tip and a metallic surface with an individual magnetic adatom. Modeling the…

强关联电子 · 物理学 2009-10-31 Avraham Schiller , Selman Hershfield

We study electronic and topographic properties of the Si(335) surface, containing Au wires parallel to the steps. We use scanning tunneling microscopy (STM) supplemented by reflection of high energy electron diffraction (RHEED) technique.…

介观与纳米尺度物理 · 物理学 2009-11-11 M. Krawiec , T. Kwapinski , M. Jalochowski

We propose a new method for atomic-scale imaging of spatial current patterns in nanoscopic quantum networks by using scanning tunneling microscopy (STM). By measuring the current flowing from the STM tip into one of the leads attached to…

介观与纳米尺度物理 · 物理学 2015-06-11 Tankut Can , Dirk K. Morr
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