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相关论文: Probing the shape of atoms in real space

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We investigate atomistic details of a single atom extraction process realized by using scanning tunneling microscope (STM) tip-cluster interaction on a Ag(111) surface at 6 K. Single atoms are extracted from a silver cluster one atom at a…

材料科学 · 物理学 2015-06-25 A. Deshpande , H. Yildirim , A. Kara , D. P. Acharya , J. Vaughn , T. S. Rahman , S. -W. Hla

We report a novel atom extraction mechanism from the native substrate by means of a scanning tunneling microscope tip-crash on a Ag(111) surface at 5 K. Individual atoms are scattered on the surface when a silver coated tip is dipped into…

材料科学 · 物理学 2015-06-24 Saw Wai Hla , Kai-Felix Braun , Violeta Iancu , Aparna Deshpande

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…

材料科学 · 物理学 2015-06-24 F. J. Giessibl , H. Bielefeldt , S. Hembacher , J. Mannhart

We present an improved way for imaging the local density of states with a scanning tunneling microscope, which consists in mapping the surface topography while keeping the differential conductance (d$I$/d$V$) constant. When archetypical…

介观与纳米尺度物理 · 物理学 2017-12-12 Gaël Reecht , Benjamin Heinrich , Hervé Bulou , Fabrice Scheurer , Laurent Limot , Guillaume Schull

Scanning tunneling microscopes (STM) are used extensively for studying and manipulating matter at the atomic scale. In spite of the critical role of the STM tip, the control of the atomic-scale shape of STM tips remains a poorly solved…

介观与纳米尺度物理 · 物理学 2017-12-11 Sumit Tewari , Koen M. Bastiaans , Milan P. Allan , Jan M. van Ruitenbeek

Observing the individual building blocks of matter is one of the primary goals of microscopy. The invention of the scanning tunneling microscope [1] revolutionized experimental surface science in that atomic-scale features on a solid-state…

材料科学 · 物理学 2008-08-04 Jannik C. Meyer , C. O. Girit , M. F. Crommie , A. Zettl

Spin-polarized scanning tunneling microscopy (SP-STM) experiments on ultrathin films with non-collinear spin textures demonstrate that resonant tunneling allows for atomic-scale spin-sensitive imaging in real space at tip-sample distances…

应用物理 · 物理学 2020-03-30 Anika Schlenhoff , Stepan Kovarik , Stefan Krause , Roland Wiesendanger

Scanning tunneling microscopy using a CO-functionalized tip is combined with simulations to explore the impact of the CO tilt angle on topographies of a single Cu atom and CO molecule adsorbed on Cu(111). Images of the Cu atom acquired with…

材料科学 · 物理学 2024-09-24 Ivan Abilio , Nicolas Néel , Jörg Kröger , Krisztián Palotás

A sparse modeling approach is proposed for analyzing scanning tunneling microscopy topography data, which contains numerous peaks corresponding to surface atoms. The method, based on the relevance vector machine with $\mathrm{L}_1$…

数据分析、统计与概率 · 物理学 2018-03-13 Masamichi J. Miyama , Koji Hukushima

Scanning tunneling microscope (STM) has presented a revolutionary methodology to the nanoscience and nanotechnology. It enables imaging the topography of surfaces, mapping the distribution of electronic density of states, and manipulating…

介观与纳米尺度物理 · 物理学 2020-09-07 Wonhee Ko , Chuanxu Ma , Giang D. Nguyen , Marek Kolmer , An-Ping Li

Scanning Tunneling Microscopy (STM) is a powerful technique that utilizes quantum tunneling to visualize atomic surfaces with high precision. This study presents detailed topographic maps and evaluates the local density of states (LDOS) for…

介观与纳米尺度物理 · 物理学 2024-02-19 Dhananjay Saikumar

The Field Ion Microscope (FIM) can be used to characterize the atomic configuration of the apex of sharp tips. These tips are well suited for Scanning Probe Microscopy (SPM) since they predetermine SPM resolution and electronic structure…

介观与纳米尺度物理 · 物理学 2012-08-07 William Paul , Yoichi Miyahara , Peter Grütter

The Scanning Tunneling Microscope is a powerful tool for studying the electronic properties at the atomic level, however it's relatively small scanning range and the fact that it can only operate on conducting samples prevents its…

We report theoretical results predicting the atomic manipulation of a silver atom on a Si(001) surface by a scanning probe tip, and providing insight into the manipulation phenomena. A molecular mechanics technique has been used, the system…

材料科学 · 物理学 2009-09-29 Laurent Pizzagalli , Alexis Baratoff

We have performed the most realistic simulation to date of the operation of a scanning tunneling microscope. Probe-sample distances from beyond tunneling to actual surface contact are covered. We simultaneously calculate forces, atomic…

材料科学 · 物理学 2009-11-07 W. A. Hofer , A. J. Fisher , R. A. Wolkow , P. Gruetter

Single-atom quantum sensors offer high spatial resolution and high sensitivity to electric and magnetic fields. Among them, trapped ions offer exceptional performance in sensing electric fields, which has been used in particular to probe…

Solid-state devices can be fabricated at the atomic scale, with applications ranging from classical logic to current standards and quantum technologies. While it is very desirable to probe these devices and the quantum states they host at…

介观与纳米尺度物理 · 物理学 2020-06-23 Kevin S. H. Ng , Benoit Voisin , Brett C. Johnson , Jeffrey C. McCallum , Joe Salfi , Sven Rogge

A simple, reliable method for preparation of bulk Cr tips for Scanning Tunneling Microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and Spin Polarized-STM (SP-STM) are investigated. Cr…

We present a very efficient and accurate method to simulate scanning tunneling microscopy images and spectra from first-principles density functional calculations. The wave-functions of the tip and sample are calculated separately on the…

材料科学 · 物理学 2016-08-16 Óscar Paz , Iván Brihuega , José M. Gómez-Rodríguez , José M. Soler

Atomic resolution imaging is demonstrated using a hybrid scanning tunneling/near-field microwave microscope (microwave-STM). The microwave channels of the microscope correspond to the resonant frequency and quality factor of a coaxial…

介观与纳米尺度物理 · 物理学 2011-08-16 Jonghee Lee , Christian J. Long , Haitao Yang , Xiao-Dong Xiang , Ichiro Takeuchi
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