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相关论文: Random Berry Phase Magnetoresistance as a Probe of…

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We present a systematic study of interface roughness and its effect on coherent dynamical processes in quantum dots. The potential due to a sharp, flat interface lifts the degeneracy of the lowest energy valleys and yields a set of valley…

介观与纳米尺度物理 · 物理学 2015-05-19 Dimitrie Culcer , Xuedong Hu , S. Das Sarma

The interference induced transverse negative magnetoresistance of GaAs/InGaAs/GaAs quantum well heterostructures has been studied in the presence of strong in-plane magnetic field. It is shown that effect of in-plane magnetic field is…

凝聚态物理 · 物理学 2009-11-10 G. M. Minkov , O. E. Rut , A. V. Germanenko , A. A. Sherstobitov , B. N. Zvonkov , D. O. Filatov

We have performed magnetoresistance measurements on polyfluorene sandwich devices in weak magnetic fields as a function of applied voltage, device temperature (10K to 300K), film thickness and electrode materials. We observed either…

软凝聚态物质 · 物理学 2016-08-16 Ö. Mermer , M. Wohlgenannt , G. Veeraraghavan , T. L. Francis

We investigate the magnetotransport properties of a thin graphite wire resting on a silicon oxide substrate. The electric field effect is demonstrated with back and side gate electrodes. We study the conductance fluctuations as a function…

介观与纳米尺度物理 · 物理学 2009-11-13 D. Graf , F. Molitor , T. Ihn , K. Ensslin

We measure and model electroadhesion across multi-asperity silicon interfaces with nanometer scale roughness. When electrically biased, our naturally oxidized silicon interfaces display a leakage current consistent with the Fowler-Nordheim…

软凝聚态物质 · 物理学 2025-08-27 Liang Peng , Stefan Kooij , HT Ciftci , Daniel Bonn , Bart Weber

Results of quantum mechanical simulations of the influence of edge disorder on transport in graphene nanoribbon metal oxide semiconductor field-effect transistors (MOSFETs) are reported. The addition of edge disorder significantly reduces…

介观与纳米尺度物理 · 物理学 2008-04-10 D. Basu , M. J. Gilbert , L. F. Register , A. H. MacDonald , S. K. Banerjee

A rough interface seems to be one of the possible reasons for low channel mobility (conductivity) in SiC MOSFETs. To evaluate the mobility by interface roughness, we drew a boundary line between amorphous insulator and crystalline 4H-SiC in…

材料科学 · 物理学 2021-01-08 Hironori Yoshioka , Tomonori Honda

We report measurements of magnetoresistance in single-layer graphene as a function of gate voltage (carrier density) at 250 mK. By examining signatures of weak localization (WL) and universal conductance fluctuations (UCF), we find a…

材料科学 · 物理学 2015-05-14 Yung-Fu Chen , Myung-Ho Bae , Cesar Chialvo , Travis Dirks , Alexey Bezryadin , Nadya Mason

New materials such as nodal-line semimetals offer a unique setting for novel transport phenomena. Here, we calculate the quantum correction to conductivity in a disordered nodal-line semimetal. The torus-shaped Fermi surface and encircled…

介观与纳米尺度物理 · 物理学 2019-05-21 Wei Chen , Hai-Zhou Lu , Oded Zilberberg

We study numerically the depinning transition of driven elastic interfaces in a random-periodic medium with localized periodic-correlation peaks in the direction of motion. The analysis of the moving interface geometry reveals the existence…

无序系统与神经网络 · 物理学 2010-10-20 S. Bustingorry , A. B. Kolton , T. Giamarchi

This is the first study on the mode localization phenomenon in microbeams due to surface roughness. A new model for microbeams with rough surfaces is developed. The natural frequencies and mode shapes of cantilever, simple supported, and…

应用物理 · 物理学 2018-03-08 Mohamed Shaat

We consider phase-coherent transport through ballistic and diffusive two-dimensional hole systems based on the Kohn-Luttinger Hamiltonian. We show that intrinsic heavy-hole light-hole coupling gives rise to clear-cut signatures of an…

介观与纳米尺度物理 · 物理学 2011-06-13 Viktor Krueckl , Michael Wimmer , Inanc Adagideli , Jack Kuipers , Klaus Richter

A microscopic calculation of the perpendicular current in doped multiple quantum wells is presented. Interface roughness is shown to affect the resonant transitions as well as to cause a nonresonant background current. The theoretical…

介观与纳米尺度物理 · 物理学 2009-10-28 Andreas Wacker , Antti-Pekka Jauho

We find the current voltage characteristics of a 2DEG-S interface in magnetic field taking into account the surface roughness. Typically in experiments $L/2R_c\gtrsim 3$, where $L$ is the surface length and $R_c$ is the cyclotron radius.…

介观与纳米尺度物理 · 物理学 2007-06-22 Nikolai M. Chtchelkatchev , Igor S. Burmistrov

Semiconductor spin qubits may show significant device-to-device variability in the presence of spin-orbit coupling mechanisms. Interface roughness, charge traps, layout or process inhomogeneities indeed shape the real space wave functions,…

介观与纳米尺度物理 · 物理学 2022-02-09 Biel Martinez , Yann-Michel Niquet

In the present work, interfacial magnetism at metal organic interface is probed using an isotope sensitive interface resolved nuclear resonance scattering technique which is made depth selective under x-rays standing wave conditions. Using…

材料科学 · 物理学 2024-05-03 Avinash G Khanderao , V R Reddy , Ilya Sergueev , Dileep Kumar

We investigate the mutual proximity effect in a normal metal contacted to a superconductor through a magnetic interface. Analytical and self-consistent numerical results are presented, and we consider both the diffusive and ballistic…

超导电性 · 物理学 2015-05-18 Jacob Linder , Asle Sudbø , Takehito Yokoyama , Roland Grein , Matthias Eschrig

We report measurements of magnetoresistance in bilayer graphene as a function of gate voltage (carrier density) and temperature. We examine multiple contributions to the magnetoresistance, including those of weak localization (WL),…

材料科学 · 物理学 2010-08-10 Yung-Fu Chen , Myung-Ho Bae , Cesar Chialvo , Travis Dirks , Alexey Bezryadin , Nadya Mason

The fourfold degeneracy of the boron acceptor ground state in silicon, which is easily lifted by any symmetry breaking perturbation, allows for a strong inhomogeneous broadening of the boron-related electron paramagnetic resonance (EPR)…

材料科学 · 物理学 2015-03-14 A. R. Stegner , H. Tezuka , T. Andlauer , M. Stutzmann , M. L. W. Thewalt , M. S. Brandt , K. M. Itoh

The topological properties of a material's electronic structure are encoded in its Berry curvature, a quantity which is intimately related to the transverse electrical conductivity. In transition metal dichalcogenides with broken inversion…

介观与纳米尺度物理 · 物理学 2020-10-21 Fei Xue , V. P. Amin , P. M. Haney
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