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Multi-modality image fusion and segmentation play a vital role in autonomous driving and robotic operation. Early efforts focus on boosting the performance for only one task, \emph{e.g.,} fusion or segmentation, making it hard to…

计算机视觉与模式识别 · 计算机科学 2023-08-07 Jinyuan Liu , Zhu Liu , Guanyao Wu , Long Ma , Risheng Liu , Wei Zhong , Zhongxuan Luo , Xin Fan

Human in-the-loop quality assurance (QA) is typically performed after medical image segmentation to ensure that the systems are performing as intended, as well as identifying and excluding outliers. By performing QA on large-scale,…

We present a novel framework for analyzing and interpreting electron microscopy images in semiconductor manufacturing using vision-language instruction tuning. The framework employs a unique teacher-student approach, leveraging pre-trained…

计算机视觉与模式识别 · 计算机科学 2024-09-13 Sakhinana Sagar Srinivas , Geethan Sannidhi , Venkataramana Runkana

Web agents powered by large language models (LLMs) can autonomously perform complex, multistep tasks in dynamic web environments. However, current evaluations mostly focus on the overall success while overlooking intermediate errors. This…

人工智能 · 计算机科学 2025-09-19 Daniel Röder , Akhil Juneja , Roland Roller , Sven Schmeier

Finite element (FE) analysis guides the design and verification of nearly all manufactured objects. It is at the core of computational engineering, enabling simulation of complex physical systems, from fluids and solids to multiphysics…

计算工程、金融与科学 · 计算机科学 2026-04-15 Rushikesh Deotale , Adithya Srinivasan , Yuan Tian , Tianyi Zhang , Pavlos Vlachos , Hector Gomez

Automated industrial inspection requires both precise defect localization and structured maintenance report generation; in current practice these tasks are handled separately, with linguistic interpretation left to human experts. This paper…

计算机视觉与模式识别 · 计算机科学 2026-05-27 Malikussaid , Imad Gohar

Fully-automatic execution is the ultimate goal for many Computer Vision applications. However, this objective is not always realistic in tasks associated with high failure costs, such as medical applications. For these tasks, semi-automatic…

计算机视觉与模式识别 · 计算机科学 2020-07-20 Jing Yu Koh , Duc Thanh Nguyen , Quang-Trung Truong , Sai-Kit Yeung , Alexander Binder

Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects.…

计算机视觉与模式识别 · 计算机科学 2024-07-18 Amit Prasad , Bappaditya Dey , Victor Blanco , Sandip Halder

We describe Fibres of Failure (FiFa), a method to classify failure modes of predictive processes using the Mapper algorithm from Topological Data Analysis. Our method uses Mapper to build a graph model of input data stratified by prediction…

计算机视觉与模式识别 · 计算机科学 2018-03-02 Leo Carlsson , Gunnar Carlsson , Mikael Vejdemo-Johansson

Robustness to out-of-distribution data is crucial for deploying modern neural networks. Recently, Vision Transformers, such as SegFormer for semantic segmentation, have shown impressive robustness to visual corruptions like blur or noise…

计算机视觉与模式识别 · 计算机科学 2024-12-17 Alberto Gonzalo Rodriguez Salgado , Maying Shen , Philipp Harzig , Peter Mayer , Jose M. Alvarez

Semiconductor imaging and analysis are critical yet understudied in deep learning, limiting our ability for precise control and optimization in semiconductor manufacturing. We introduce a small-scale multimodal framework for analyzing…

计算机视觉与模式识别 · 计算机科学 2024-08-26 Sakhinana Sagar Srinivas , Chidaksh Ravuru , Geethan Sannidhi , Venkataramana Runkana

Deep learning-based methods have achieved promising results on surgical instrument segmentation. However, the high computation cost may limit the application of deep models to time-sensitive tasks such as online surgical video analysis for…

计算机视觉与模式识别 · 计算机科学 2021-07-27 Shan Lin , Fangbo Qin , Haonan Peng , Randall A. Bly , Kris S. Moe , Blake Hannaford

The necessity of abundant annotated data and complex network architectures presents a significant challenge in deep-learning Salient Object Detection (deep SOD) and across the broader deep-learning landscape. This challenge is particularly…

计算机视觉与模式识别 · 计算机科学 2025-04-16 Felipe Crispim Salvagnini , Jancarlo F. Gomes , Cid A. N. Santos , Silvio Jamil F. Guimarães , Alexandre X. Falcão

In the early stages of semiconductor equipment development, obtaining large quantities of raw optical images poses a significant challenge. This data scarcity hinder the advancement of AI-powered solutions in semiconductor manufacturing. To…

计算机视觉与模式识别 · 计算机科学 2025-11-11 ChunLiang Wu , Xiaochun Li

This paper challenges the cross-domain semantic segmentation task, aiming to improve the segmentation accuracy on the unlabeled target domain without incurring additional annotation. Using the pseudo-label-based unsupervised domain…

计算机视觉与模式识别 · 计算机科学 2021-12-02 Kai Zhang , Yifan Sun , Rui Wang , Haichang Li , Xiaohui Hu

Finite Element Analysis (FEA) is a powerful but computationally intensive method for simulating physical phenomena. Recent advancements in machine learning have led to surrogate models capable of accelerating FEA. Yet there are still…

机器学习 · 计算机科学 2025-02-18 Georgios Triantafyllou , Panagiotis G. Kalozoumis , George Dimas , Dimitris K. Iakovidis

Federated learning has been identified as an efficient decentralized training paradigm for scaling the machine learning model training on a large number of devices while guaranteeing the data privacy of the trainers. FedAvg has become a…

机器学习 · 计算机科学 2024-04-23 Haotian Xu , Zhaorui Zhang , Sheng Di , Benben Liu , Khalid Ayed Alharthi , Jiannong Cao

With the advent of 5G networks and technologies, ensuring the integrity and performance of packet core traffic is paramount. During network analysis, test files such as Packet Capture (PCAP) files and log files will contain errors if…

网络与互联网体系结构 · 计算机科学 2025-08-14 Joseph H. R. Isaac , Harish Saradagam , Nallamothu Pardhasaradhi

The growing availability of sensors within semiconductor manufacturing processes makes it feasible to detect defective wafers with data-driven models. Without directly measuring the quality of semiconductor devices, they capture the…

机器学习 · 计算机科学 2025-01-08 Yifeng Zhang , Bryan Baker , Shi Chen , Chao Zhang , Yu Huang , Qi Zhao , Sthitie Bom

Image segmentation is fundamental to microstructural analysis for defect identification and structure-property correlation, yet remains challenging due to pronounced heterogeneity in materials images arising from varied processing and…

计算机视觉与模式识别 · 计算机科学 2026-03-17 Sanjeev S. Navaratna , Nikhil Thawari , Gunashekhar Mari , Amritha V P , Murugaiyan Amirthalingam , Rohit Batra