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Persistent Fault Attack (PFA) is a recently proposed Fault Attack (FA) method in CHES 2018. It is able to recover full AES secret key in the Single-Byte-Fault scenario. It is demonstrated that classical FA countermeasures, such as Dual…

密码学与安全 · 计算机科学 2025-12-15 Yukun Cheng , Mengce Zheng , Fan Huang , Jiajia Zhang , Honggang Hu , Nenghai Yu

Change detection has been a hotspot in remote sensing technology for a long time. With the increasing availability of multi-temporal remote sensing images, numerous change detection algorithms have been proposed. Among these methods, image…

计算机视觉与模式识别 · 计算机科学 2019-09-06 Bo Du , Lixiang Ru , Chen Wu , Liangpei Zhang

Autonomous critical systems, such as satellites and space rovers, must be able to detect the occurrence of faults in order to ensure correct operation. This task is carried out by Fault Detection and Identification (FDI) components, that…

计算机科学中的逻辑 · 计算机科学 2019-03-14 Marco Bozzano , Alessandro Cimatti , Marco Gario , Stefano Tonetta

The rapid evolution of generative AI has increased the threat of realistic audio-visual deepfakes, demanding robust detection methods. Existing solutions primarily address unimodal (audio or visual) forgeries but struggle with multimodal…

计算机视觉与模式识别 · 计算机科学 2025-06-17 Jian Wang , Baoyuan Wu , Li Liu , Qingshan Liu

Diffusion models (DMs) are powerful generative models capable of producing high-fidelity images but are constrained by high computational costs due to iterative multi-step inference. While Neural Architecture Search (NAS) can optimize DMs,…

计算机视觉与模式识别 · 计算机科学 2025-06-06 Hongtao Huang , Xiaojun Chang , Lina Yao

We present FMAS, a fast multi-objective neural architecture search framework for semantic segmentation. FMAS subsamples the structure and pre-trained parameters of DeepLabV3+, without fine-tuning, dramatically reducing training time during…

计算机视觉与模式识别 · 计算机科学 2023-03-30 Zhuoran Xiong , Marihan Amein , Olivier Therrien , Warren J. Gross , Brett H. Meyer

Deep learning methods have shown promising performance in fault diagnosis for multimode process. Most existing studies assume that the collected health state categories from different operating modes are identical. However, in real…

机器学习 · 计算机科学 2025-10-30 Guangqiang Li , M. Amine Atoui , Xiangshun Li

Semiconductor wafer defect classification is critical for ensuring high precision and yield in manufacturing. Traditional CNN-based models often struggle with class imbalances and recognition of the multiple overlapping defect types in…

计算机视觉与模式识别 · 计算机科学 2025-04-04 Faisal Mohammad , Duksan Ryu

Generating professional financial reports is a labor-intensive and intellectually demanding process that current AI systems struggle to fully automate. To address this challenge, we introduce FinSight (Financial InSight), a novel multi…

计算与语言 · 计算机科学 2025-10-21 Jiajie Jin , Yuyao Zhang , Yimeng Xu , Hongjin Qian , Yutao Zhu , Zhicheng Dou

Scanning transmission electron microscopy (STEM) has become a cornerstone instrument for semiconductor materials metrology, enabling nanoscale analysis of complex multilayer structures that define device performance. Developing effective…

The success of large language models has inspired the computer vision community to explore image segmentation foundation model that is able to zero/few-shot generalize through prompt engineering. Segment-Anything(SAM), among others, is the…

计算机视觉与模式识别 · 计算机科学 2024-04-11 Haojie Zhang , Yongyi Su , Xun Xu , Kui Jia

The automatic diagnosis of various retinal diseases from fundus images is important to support clinical decision-making. However, developing such automatic solutions is challenging due to the requirement of a large amount of human-annotated…

计算机视觉与模式识别 · 计算机科学 2020-07-23 Xiaomeng Li , Mengyu Jia , Md Tauhidul Islam , Lequan Yu , Lei Xing

Automated segmentation is a fundamental medical image analysis task, which enjoys significant advances due to the advent of deep learning. While foundation models have been useful in natural language processing and some vision tasks for…

计算机视觉与模式识别 · 计算机科学 2025-05-12 Hanxue Gu , Haoyu Dong , Jichen Yang , Maciej A. Mazurowski

Optical Flow Estimation aims to find the 2D dense motion field between two frames. Due to the limitation of model structures and training datasets, existing methods often rely too much on local clues and ignore the integrity of objects,…

计算机视觉与模式识别 · 计算机科学 2023-12-22 Shili Zhou , Ruian He , Weimin Tan , Bo Yan

Multivariate or multichannel data have become ubiquitous in many modern scientific and engineering applications, e.g., biomedical engineering, owing to recent advances in sensor and computing technology. Processing these data sets is…

信号处理 · 电气工程与系统科学 2020-05-26 Sikender Gul , Muhammad Faisal Siddiqui , Naveed Ur Rehman

Under the organization of the base station (BS), wireless federated learning (FL) enables collaborative model training among multiple devices. However, the BS is merely responsible for aggregating local updates during the training process,…

信息论 · 计算机科学 2023-10-05 Jingheng Zheng , Wanli Ni , Hui Tian , Deniz Gunduz , Tony Q. S. Quek , Zhu Han

In semi-supervised learning (SSL) for enhancing the performance of graph neural networks (GNNs) with unlabeled data, introducing mutually independent decision factors for cross-validation is regarded as an effective strategy to alleviate…

机器学习 · 计算机科学 2025-08-13 Long Wang , Kai Liu

Recently, Segment Anything Model (SAM) has demonstrated strong generalizability in various instance segmentation tasks. However, its performance is severely dependent on the quality of manual prompts. In addition, the RGB images that…

计算机视觉与模式识别 · 计算机科学 2026-02-09 Yihan Shang , Wei Wang , Chao Huang , Xinghui Dong

We study the training of Vision Transformers for semi-supervised image classification. Transformers have recently demonstrated impressive performance on a multitude of supervised learning tasks. Surprisingly, we show Vision Transformers…

计算机视觉与模式识别 · 计算机科学 2022-07-19 Zejia Weng , Xitong Yang , Ang Li , Zuxuan Wu , Yu-Gang Jiang

In semiconductor manufacturing, the wafer dicing process is central yet vulnerable to defects that significantly impair yield - the proportion of defect-free chips. Deep neural networks are the current state of the art in (semi-)automated…

计算机视觉与模式识别 · 计算机科学 2024-07-31 Zhining Hu , Tobias Schlosser , Michael Friedrich , André Luiz Vieira e Silva , Frederik Beuth , Danny Kowerko
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