相关论文: Image-Intrinsic Priors for Integrated Circuit Defe…

Deep learning models have achieved state-of-the-art performance in many computer vision tasks. However, in real-world scenarios, novel classes that were unseen during training often emerge, requiring models to acquire new knowledge…

With the advent of advances in self-supervised learning, paired clean-noisy data are no longer required in deep learning-based image denoising. However, existing blind denoising methods still require the assumption with regard to noise…

This paper addresses the problem of defect segmentation in semiconductor manufacturing. The input of our segmentation is a scanning-electron-microscopy (SEM) image of the candidate defect region. We train a U-net shape network to segment…

Monocular depth estimation is fundamental for 3D scene understanding and downstream applications. However, even under the supervised setup, it is still challenging and ill-posed due to the lack of full geometric constraints. Although a…

We propose a novel unsupervised backlit image enhancement method, abbreviated as CLIP-LIT, by exploring the potential of Contrastive Language-Image Pre-Training (CLIP) for pixel-level image enhancement. We show that the open-world CLIP…

Early detection of incipient faults is of vital importance to reducing maintenance costs, saving energy, and enhancing occupant comfort in buildings. Popular supervised learning models such as deep neural networks are considered promising…

As the digital landscape becomes more interconnected, the frequency and severity of zero-day attacks, have significantly increased, leading to an urgent need for innovative Intrusion Detection Systems (IDS). Machine Learning-based IDS that…

In the Reverse Engineering and Hardware Assurance domain, a majority of the data acquisition is done through electron microscopy techniques such as Scanning Electron Microscopy (SEM). However, unlike its counterparts in optical imaging,…

Machine-vision-based defect classification techniques have been widely adopted for automatic quality inspection in manufacturing processes. This article describes a general framework for classifying defects from high volume data batches…

Surface inspection systems are an important application domain for computer vision, as they are used for defect detection and classification in the manufacturing industry. Existing systems use hand-crafted features which require extensive…

Recently, Deep Image Prior (DIP) has demonstrated strong capabilities for solving inverse imaging problems (IIPs) by optimizing a randomly initialized convolutional neural network in a training-data-free regime. However, DIP suffers from…

We explore the problem of Incremental Generalized Category Discovery (IGCD). This is a challenging category incremental learning setting where the goal is to develop models that can correctly categorize images from previously seen…

Surface defect inspection is of great importance for industrial manufacture and production. Though defect inspection methods based on deep learning have made significant progress, there are still some challenges for these methods, such as…

Modern supervised semantic segmentation methods are usually finetuned based on the supervised or self-supervised models pre-trained on ImageNet. Recent work shows that transferring the knowledge from CLIP to semantic segmentation via prompt…

Implicit neural representations (INRs) have emerged as a powerful paradigm for medical imaging via physics-informed unsupervised learning. Classical INRs optimize an entire network from scratch for each subject, leading to inefficient…

Implicit degradation modeling-based blind super-resolution (SR) has attracted more increasing attention in the community due to its excellent generalization to complex degradation scenarios and wide application range. How to extract more…

Discovering novel concepts in unlabelled datasets and in a continuous manner is an important desideratum of lifelong learners. In the literature such problems have been partially addressed under very restricted settings, where novel classes…

Non-blind deblurring methods achieve decent performance under the accurate blur kernel assumption. Since the kernel uncertainty (i.e. kernel error) is inevitable in practice, semi-blind deblurring is suggested to handle it by introducing…

Unsupervised Anomaly Detection (UAD) with incremental training is crucial in industrial manufacturing, as unpredictable defects make obtaining sufficient labeled data infeasible. However, continual learning methods primarily rely on…

Intrinsic decomposition from a single image is a highly challenging task, due to its inherent ambiguity and the scarcity of training data. In contrast to traditional fully supervised learning approaches, in this paper we propose learning…