相关论文: Information in 4D-STEM: Where it is, and How to Us…
The nature of stacking faults - whether intrinsic or extrinsic - plays a pivotal role in defect-mediated processes in crystalline materials. Yet, current electron microscopy techniques for their reliable analysis remain limited to either…
Electron channeling contrast imaging (ECCI) is a scanning electron microscopy (SEM) based technique that enables bulk-sample characterization of crystallographic defects (e.g. dislocations, stacking faults, low angle boundaries). Despite…
The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical…
Disordered metasurfaces provide a versatile platform for harnessing near- and far-field scattered light. Most research has focused on either particulate topologies composed of individual, well-identified metaatoms or, to a lesser extent,…
The newly emerging field of wave front shaping in complex media has recently seen enormous progress. The driving force behind these advances has been the experimental accessibility of the information stored in the scattering matrix of a…
The advantages of convergent beam electron diffraction for symmetry determination at the scale of a few nm are well known. In practice, the approach is often limited due to the restriction on the angular range of the electron beam imposed…
One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged…
The presence of a scattering medium in the imaging path between an object and an observer is known to severely limit the visual acuity of the imaging system. We present an approach to circumvent the deleterious effects of scattering, by…
The challenge of imaging low-density objects in an electron microscope without causing beam damage is significant in modern TEM. This is especially true for life science imaging, where the sample, rather than the instrument, still…
The evolution of the scanning modules for scanning transmission electron microscopes (STEM) has realized the possibility to generate arbitrary scan pathways, an approach currently explored to improve acquisition speed and to reduce electron…
Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or beam drift, manifesting as distortions within images or…
Considerable inroads have recently been made on algorithms to determine the sample potential from four-dimensional scanning transmission electron microscopy data from thick samples where multiple scattering cannot be neglected. This paper…
Electrical Impedance Tomography (EIT) is a powerful imaging technique with diverse applications, e.g., medical diagnosis, industrial monitoring, and environmental studies. The EIT inverse problem is about inferring the internal conductivity…
Due to the high potential for abuse of GenAI systems, the task of detecting synthetic images has recently become of great interest to the research community. Unfortunately, existing image-space detectors quickly become obsolete as new…
We consider the problem of elastic diffraction tomography, which consists in reconstructing elastic properties (i.e. mass density and elastic Lam\'e parameters) of a weakly scattering medium from full-field data of scattered waves outside…
Wavefront shaping allows focusing light through or inside strongly scattering media, but the background intensity also increases due to long-range correlations, reducing the target's contrast. By manipulating non-local intensity…
This paper investigates the inverse biharmonic scattering problems of identifying the shape and location of the obstacle with phased and phaseless measurement data. A direct imaging method based on reverse time migration is proposed for…
Advancements in fast electron detectors have enabled the statistically significant sampling of crystal structures on the nanometre scale by means of Scanning Electron Nanobeam Diffraction (SEND). Characterisation of structural similarity…
The information content and properties of the cross section for atom scattering from a defect on a flat surface are investigated. Using the Sudden approximation, a simple expression is obtained that relates the cross section to the…
Established x-ray diffraction methods allow for high-resolution structure determination of crystals, crystallized protein structures or even single molecules. While these techniques rely on coherent scattering, incoherent processes like…