相关论文: On Overlap Ratio in Defocused Electron Ptychograph…
Compared with conventional single-energy computed tomography (CT), dual-energy CT (DECT) provides better material differentiation but most DECT imaging systems require dual full-angle projection data at different X-ray spectra. Relaxing the…
With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous works have previously highlighted and contrasted performance…
The technique known as 4D-STEM has recently emerged as a powerful tool for the local characterization of crystalline structures in materials, such as cathode materials for Li-ion batteries or perovskite materials for photovoltaics. However,…
Thin film oxides are a source of endless fascination for the materials scientist. These materials are highly flexible, can be integrated into almost limitless combinations, and exhibit many useful functionalities for device applications.…
This paper presents novel strategies for spawning and fusing submaps within an elastic dense 3D reconstruction system. The proposed system uses spatial understanding of the scanned environment to control memory usage growth by fusing…
Direct ptychography enables the retrieval of information encoded in the phase of an electron wave passing through a thin sample by deconvolving the interference effects of a converged probe with known aberrations. Under the weak phase…
High-resolution transmission electron microscopy (HRTEM) is an important method for imaging beam sensitive materials often under cryo conditions. Electron ptychography in the scanning transmission electron microscope (STEM) has been shown…
Defects in crystalline materials control the properties of materials, and their characterization focuses our strategies to optimize performance. Electron microscopy has served as the backbone of our understanding of defect structure and…
SPECT (Single-photon Emission Computerized Tomography) and PET (Positron Emission Tomography) are essential medical imaging tools, for which the sampling angle number, scan time should be chosen carefully to compromise between image quality…
Leveraging the overfitting property of deep neural networks (DNNs) is trending in video delivery systems to enhance video quality within bandwidth limits. Existing approaches transmit overfitted super-resolution (SR) model streams for…
The achievable instrumental performance of a scanning transmission electron microscope (STEM) is determined by the size and shape of the incident electron probe. The most important optical factor in achieving the optimum probe profile is…
Ptychography has rapidly grown in the fields of X-ray and electron imaging for its unprecedented ability to achieve nano or atomic scale resolution while simultaneously retrieving chemical or magnetic information from a sample. A…
The stochastic density functional theory (DFT) [Phys. Rev. Lett. 111, 106402 (2013)] is a valuable linear scaling approach to Kohn-Sham DFT that does not rely on the sparsity of the density matrix. Linear (and often sub-linear) scaling is…
High-resolution mapping of electronic properties at oxide heterointerfaces remains challenging due to probe delocalization and overlapping signals. In this work, we employ monochromated, probe-corrected scanning transmission electron…
Deep learning based PET image reconstruction methods have achieved promising results recently. However, most of these methods follow a supervised learning paradigm, which rely heavily on the availability of high-quality training labels. In…
Addressing the need for efficient and integrated multiscale crystallographic and defect analyses of advanced materials, this paper presents the implementation of a new multi-configuration detection system, integrating a single…
Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its…
We report resolution enhancement in scanning electron microscopy (SEM) images using a generative adversarial network. We demonstrate the veracity of this deep learning-based super-resolution technique by inferring unresolved features in…
Four-dimensional scanning transmission electron microscopy (4D-STEM) enables mapping of diffraction information with nanometer-scale spatial resolution, offering detailed insight into local structure, orientation, and strain. However, as…
A special kind of degeneracies known as the exceptional points (EPs), for resonant states on a dielectric periodic slab, are investigated. Due to their unique properties, EPs have found important applications in lasing, sensing,…