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Electron tomography is a technique used in both materials science and structural biology to image features well below optical resolution limit. In this work, we present a new algorithm for reconstructing the three-dimensional(3D)…

信号处理 · 电气工程与系统科学 2018-07-12 David Ren , Michael Chen , Laura Waller , Colin Ophus

Ptychography is a scanning coherent diffractive imaging technique that enables imaging nanometer-scale features in extended samples. One main challenge is that widely used iterative image reconstruction methods often require significant…

图像与视频处理 · 电气工程与系统科学 2024-12-17 Canberk Ekmekci , Tekin Bicer , Zichao Wendy Di , Junjing Deng , Mujdat Cetin

Scanning transmission electron microscopy (STEM) is the most widespread adopted tool for atomic scale characterization of two-dimensional (2D) materials. Many 2D materials remain susceptible to electron beam damage, despite the standardized…

材料科学 · 物理学 2021-08-11 Sytze de Graaf , Majid Ahmadi , Ivan Lazić , Eric G. T. Bosch , Bart J. Kooi

In recent years, histopathology images have been increasingly used as a diagnostic tool in the medical field. The process of accurately diagnosing a biopsy sample requires significant expertise in the field, and as such can be…

图像与视频处理 · 电气工程与系统科学 2019-09-24 Alison K. Cheeseman , Hamid Tizhoosh , Edward R. Vrscay

Dual-energy computed tomography (DECT) has shown great potential and promising applications in advanced imaging fields for its capabilities of material decomposition. However, image reconstructions and decompositions under sparse views…

医学物理 · 物理学 2016-08-01 Lei Li , Ailong Cai , Linyuan Wang , Bin Yan , Hanming Zhang , Zhizhong Zheng , Wenkun Zhang , Wanli Lu , Guoen Hu

Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at length scales from the micron to sub-{\AA}ngstr\"om. The…

仪器与探测器 · 物理学 2022-06-07 Bryan D Esser , Joanne Etheridge

The reduced dimensionality in two-dimensional materials leads a wealth of unusual properties, which are currently explored for both fundamental and applied sciences. In order to study the crystal structure, edge states, the formation of…

介观与纳米尺度物理 · 物理学 2021-01-04 Felix Kern , Martin Linck , Daniel Wolf , Nasim Alem , Himani Arora , Sibylle Gemming , Artur Erbe , Alex Zettl , Bernd Büchner , Axel Lubk

Particle image (PI) overlap presents a significant challenge in single-camera particle tracking and sizing techniques such as Defocusing Particle Tracking Velocimetry (DPTV) and Interferometric Particle Imaging (IPI). In DPTV, overlap…

仪器与探测器 · 物理学 2025-06-24 Christian Sax , Jochen Kriegseis

Ptychography is a computational method of microscopy that recovers high-resolution transmission images of samples from a series of diffraction patterns. While conventional phase retrieval algorithms can iteratively recover the images, they…

图像与视频处理 · 电气工程与系统科学 2024-10-24 Ryuma Nakahata , Shehtab Zaman , Mingyuan Zhang , Fake Lu , Kenneth Chiu

Electrical properties (EP), namely permittivity and electric conductivity, dictate the interactions between electromagnetic waves and biological tissue. EP can be potential biomarkers for pathology characterization, such as cancer, and…

Magnetic resonance imaging (MRI) based electrical properties tomography (EPT) is the quantification of the conductivity and permittivity of different tissues. These electrical properties can be obtained through different reconstruction…

Fourier Ptychography is a recently proposed imaging technique that yields high-resolution images by computationally transcending the diffraction blur of an optical system. At the crux of this method is the phase retrieval algorithm, which…

计算机视觉与模式识别 · 计算机科学 2018-05-10 Lokesh Boominathan , Mayug Maniparambil , Honey Gupta , Rahul Baburajan , Kaushik Mitra

We propose algorithms based on an optimisation method for inverse multislice ptychography in, e.g. electron microscopy. The multislice method is widely used to model the interaction between relativistic electrons and thick specimens. Since…

Correlative light and electron microscopy is a powerful tool to study the internal structure of cells. It combines the mutual benefit of correlating light (LM) and electron (EM) microscopy information. However, the classical approach of…

By circumventing the resolution limitations of optics, coherent diffractive imaging (CDI) and ptychography are making their way into scientific fields ranging from X-ray imaging to astronomy. Yet, the need for time consuming iterative phase…

计算物理 · 物理学 2023-10-13 Oliver Hoidn , Aashwin Ananda Mishra , Apurva Mehta

Exceptional points (EP) are non-Hermitian spectral degeneracies where both eigenvalues and their corresponding eigenvectors coalesce. Recently, EPs have attracted a lot of attention as a means to enhance the responsivity of sensors, via the…

应用物理 · 物理学 2022-02-22 Rodion Kononchuk , Jizhe Cai , Fred Ellis , Ramathasan Thevamaran , Tsampikos Kottos

While multislice electron ptychography can provide thermal-vibration limited resolution and 3D information, it relies on the proper selection of many intertwined experimental and computational parameters. Here, we outline a theoretical…

材料科学 · 物理学 2023-11-28 Colin Gilgenbach , Xi Chen , James M. LeBeau

The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by the sample causes the diffraction pattern intensity to shift…

仪器与探测器 · 物理学 2018-04-25 L. Clark , H. G. Brown , D. M. Paganin , M. J. Morgan , T. Matsumoto , N. Shibata , T. C. Petersen , S. D. Findlay

Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed to achieve these results compared to conventional 4-D…

In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…