相关论文: Color simulation for multilayered thin films using…
In this work, we present a detailed procedure of computer implementation of the laws of refraction and reflection on an arbitrary surface with rotational symmetry with respect to the propagation axis. The goal is to facilitate the…
Historically, spectroscopic techniques have been essential for studying the optical properties of thin solid films. However, existing formulae for both normal transmission and reflection spectroscopy often rely on simplified theoretical…
Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques to study 2D materials. However, a thorough description of the experimental setups needed to carry out these…
Images are the standard input for vision algorithms, but one-shot infield reflectance measurements are creating new opportunities for recognition and scene understanding. In this work, we address the question of what reflectance can reveal…
Thin film technology is a most relevant field in terms of number of different applications and, even more, in how widespread the use of the technology is. Virtually all optical devices involving light beams or with imaging capabilities…
Color constancy and color illusion perception are two phenomena occurring in the human visual system, which can help us reveal unknown mechanisms of human perception. For decades computer vision scientists have developed numerous color…
Optical images of transparent three-dimensional objects can be different from a replica of the object's cross section in the image plane due to refraction at the surface or in the body of the object. Simulations of the object's image are…
Eliminating reflections caused by incident light interacting with reflective medium remains an ill-posed problem in the image restoration area. The primary challenge arises from the overlapping of reflection and transmission components in…
Reflectometry is a technique that uses the light reflected by a sample to determine properties of the sample. Interferometric reflectometry uses interference between two beams, one of which is incident on ---and reflected back by--- a…
The refraction is theoretically considered of ultimately short pulses at interface of two dielectrics that contains a thin film of nonlinear metamaterial. For the model of metamaterial composed of nanoparticles and magnetic nanocircuits…
Reflective ptychography is a promising lensless imaging technique with a wide field of view, offering significant potential for applications in semiconductor manufacturing and detection. However, many semiconductor materials are coated with…
A versatile X-ray/neutron reflectivity (specular) simulator using LabVIEW(National Instruments Corp.) for structural study of a multi-layer thin film having any combination, including the repetitions, of nano-scale layers of different…
Thin-film optical filters can nowadays be integrated onto pixels of commercial image sensors used for spectral imaging. A drawback of having more filters on an image sensor is a loss in spatial resolution which could be regained by using…
It is shown that for thin metallic films thickness of which does not exceed thickness of skin layer, the problem allows analytical solution. In the field of resonant frequencies the analysis of dependence of coefficients of transmission,…
The Python colorspace package provides a toolbox for mapping between different color spaces which can then be used to generate a wide range of perceptually-based color palettes for qualitative or quantitative (sequential or diverging)…
A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…
Achieving the desired optical response from a multilayer thin-film structure over a broad range of wavelengths and angles of incidence can be challenging. An advanced thin-film structure can consist of multiple materials with different…
The reflections caused by common semi-reflectors, such as glass windows, can impact the performance of computer vision algorithms. State-of-the-art methods can remove reflections on synthetic data and in controlled scenarios. However, they…
In this paper we show how students can measure optical features of smartphone displays through three experiments. Observing diffraction patterns from smartphone displays allows students to determine the Pixels Per Inch (PPI). Observing…
The Multi-Layer Thin Films Problem is a materials science problem that aims to enhance the reflectance of a metallic substrate by designing multi-layer coatings composed of different dielectric materials and thicknesses. While previous…