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Domain-wall dynamics in ferroelectric materials are strongly position-dependent since each polar interface is locked into a unique local microstructure. This necessitates spatially resolved studies of the wall-pinning using scanning-probe…

材料科学 · 物理学 2025-06-02 Kamyar Barakati , Yu Liu , Hiroshi Funakubo , Sergei V. Kalinin

Harnessing the unique properties of non-collinear antiferromagnets (AFMs) will be essential for exploiting the full potential of antiferromagnetic spintronics. Indeed, many of the effects enabling ferromagnetic spintronic devices have a…

The control of domain walls or spin textures is crucial for spintronic applications of antiferromagnets. Despite many efforts, it has been challenging to directly visualize antiferromagnetic domains or domain walls with nanoscale…

材料科学 · 物理学 2020-03-06 Paul M. Sass , Wenbo Ge , Jiaqiang Yan , D. Obeysekera , J. J Yang , Weida Wu

Piezoresponse Force Microscopy (PFM) is one of the most widespread methods for investigating and visualizing ferroelectric domain structures down to the nanometer length scale. PFM makes use of the direct coupling of the piezoelectric…

Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…

介观与纳米尺度物理 · 物理学 2025-04-21 Roger Proksch , Ryan Wagner

Piezoresponse Force Microscopy (PFM) has emerged as a primary tool for imaging, domain engineering, and switching spectroscopy on ferroelectric materials. Quantitative interpretation of PFM data including measurements of the intrinsic width…

材料科学 · 物理学 2007-05-23 Anna N. Morozovska , Svetlana L. Bravina , Eugene A. Eliseev , Sergei V. Kalinin

High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and…

The structure of a single antiparallel ferroelectric domain wall in LiNbO3 is quantitatively mapped by piezoelectric force microscopy (PFM) with calibrated probe geometry. The PFM measurements are performed for 49 probes with the radius…

We study local oxidation induced by dynamic atomic force microscopy (AFM), commonly called TappingMode AFM. This minimizes the field induced forces, which cause the tip to blunt, and enables us to use very fine tips. We are able to…

介观与纳米尺度物理 · 物理学 2007-05-23 B. Irmer , M. Kehrle , H. Lorenz , J. P. Kotthaus

Extraordinary physical properties arise at polar interfaces in oxide materials, including the emergence of two-dimensional electron gases, sheet-superconductivity, and multiferroicity. A special type of polar interface are ferroelectric…

The contrast mechanism for ferroelectric domain imaging via piezoresponse force microscopy (PFM) is investigated. A novel analysis of PFM measurements is presented which takes into account the background caused by the experimental setup.…

材料科学 · 物理学 2016-08-31 T. Jungk , A. Hoffmann , E. Soergel

We present Advancing Front Mapping (AFM), a provably robust algorithm for the computation of surface mappings to simple base domains. Given an input mesh and a convex or star-shaped target domain, AFM installs a (possibly refined) version…

计算几何 · 计算机科学 2024-01-08 Marco Livesu

Atomic Force Microscopy (AFM) is a widely employed tool for micro-/nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro-/nanostructures precisely due to limitations such as incomplete…

计算机视觉与模式识别 · 计算机科学 2024-01-23 Shuo Chen , Mao Peng , Yijin Li , Bing-Feng Ju , Hujun Bao , Yuan-Liu Chen , Guofeng Zhang

We report coherent X-ray imaging of antiferromagnetic (AFM) domains and domain walls in MnBi$_2$Te$_4$, an intrinsic AFM topological insulator. This technique enables direct visualization of domain morphology without reconstruction…

材料科学 · 物理学 2025-10-28 M. G. Kim , S. Boney , L. Burgard , L. Rutowski , C. Mazzoli

Antiferromagnetic materials present us with rich and exciting physics, which we can exploit to open new avenues in spintronic device applications. We explore perpendicularly magnetized exchange biased systems of Pt/Co/IrMn and Pt/Co/FeMn,…

介观与纳米尺度物理 · 物理学 2018-08-22 Risalat A. Khan , Hans T. Nembach , Mannan Ali , Justin M. Shaw , Christopher H. Marrows , Thomas A. Moore

Topologically protected whirling magnetic textures could emerge as data carriers in next-generation post-Moore computing. Such textures are abundantly observed in ferromagnets (FMs); however, their antiferromagnetic (AFM) counterparts are…

材料科学 · 物理学 2022-07-13 Jack Harrison , Hariom Jani , Paolo G. Radaelli

Atomic Force Microscopy (AFM) is a suitable tool to perform tribological characterization of materials down to the nanometer scale. An important aspect in nanofriction measurements of corrugated samples is the local tilt of the surface,…

凝聚态物理 · 物理学 2017-06-22 A. Podesta' , G. Fantoni , P. Milani

Coupling between electrical and mechanical phenomena is a near-universal characteristic of inorganic and biological systems alike, with examples ranging from ferroelectric perovskites to electromotor proteins in cellular membranes.…

材料科学 · 物理学 2016-11-15 Sergei V. Kalinin , Andrei Rar , Stephen Jesse

We develop and implement an automated experiment in multimodal imaging to probe structural, chemical, and functional behaviors in complex materials and elucidate the dominant physical mechanisms that control device function. Here the…

Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the…

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