相关论文: Differentiable Edge-based OPC

Optical computing is considered a promising solution for the growing demand for parallel computing in various cutting-edge fields, requiring high integration and high speed computational capacity. In this paper, we propose a novel optical…

Industrial cyber-physical systems (ICPS) integrate physical processes with computational and communication technologies in industrial settings. With the support of edge computing technology, it is feasible to schedule large-scale sensors…

In this paper, we propose a novel gradient-based method to optimize curvilinear masks in optical lithography. The mask pattern is represented by periodic B-spline curves. We apply Delaunay triangulation to discretize the domains circled by…

Uncertainty estimation is crucial in safety-critical applications, where robust out-of-distribution (OOD) detection is essential. Traditional Bayesian methods, though effective, are often hindered by high computational demands. As an…

We introduce the Optimizing a Discrete Loss (ODIL) framework for the numerical solution of Partial Differential Equations (PDE) using machine learning tools. The framework formulates numerical methods as a minimization of discrete residuals…

Optical coherence tomography (OCT) is a prevalent, interferometric, high-resolution imaging method with broad biomedical applications. Nonetheless, OCT images suffer from an artifact, called speckle which degrades the image quality. Digital…

Application-specific optical processors have been considered disruptive technologies for modern computing that can fundamentally accelerate the development of artificial intelligence (AI) by offering substantially improved computing…

Out-of-distribution (OoD) detection and segmentation have attracted growing attention as concerns about AI security rise. Conventional OoD detection methods identify the existence of OoD objects but lack spatial localization, limiting their…

Edge detection has long been an important problem in the field of computer vision. Previous works have explored category-agnostic or category-aware edge detection. In this paper, we explore edge detection in the context of object instances.…

Visual defect detection plays an important role in intelligent industry. Patch based methods consider visual images as a collection of image patches according to positions, which have stronger discriminative ability for small defects in…

Neural implicit surfaces can be used to recover accurate 3D geometry from imperfect point clouds. In this work, we show that state-of-the-art techniques work by minimizing an approximation of a one-sided Chamfer distance. This shape metric…

Large-scale deep learning models are increasingly constrained by their immense energy consumption, limiting their scalability and applicability for edge intelligence. In-memory computing (IMC) offers a promising solution by addressing the…

Superpixel segmentation has recently seen important progress benefiting from the advances in differentiable deep learning. However, the very high-resolution superpixel segmentation still remains challenging due to the expensive memory and…

Linear optics is a promising route to building quantum technologies that operate at room temperature and can be manufactured scalably on integrated photonic platforms. However, scaling up linear optics requires high-performance operation…

Inverse design (ID) is a computational method that systematically explores a design space to find optimal device geometries based on specific performance criteria. In silicon photonics, ID often leads to devices with design features that…

Optical metasurfaces have revolutionized analog computing and image processing at sub-wavelength scales with faster speed and lower power consumption. They typically involve spatial differentiation with engineered angular dispersion.…

Achieving quantum-limited motional control of optically trapped particles beyond the sub-micrometer scale is an outstanding problem in levitated optomechanics. A key obstacle is solving the light scattering problem and identifying particle…

Edge detection, as a fundamental task in computer vision, has garnered increasing attention. The advent of deep learning has significantly advanced this field. However, recent deep learning-based methods generally face two significant…

With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges…

Classical Distributed Model Predictive Control (DiMPC) requires multiple iterations to achieve convergence, leading to high computational and communication burdens. This work focuses on the improvement of an iteration-free distributed MPC…