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We explore the potential of Time-Of-Flight Medium Energy Ion Scattering (TOFMEIS) for thin film analysis and analyze possible difficulties in evaluation of experimental spectra. Issues regarding different combinations of composition and…

We report results of high-resolution TOF SIMS (time of flight secondary ion mass spectrometry) depth profiling experiments on a nanolayered structure, a stack of 16 alternating MgO and ZnO ~5.5 nm layers grown on a Si substrate by atomic…

材料科学 · 物理学 2012-04-30 S. V. Baryshev , A. V. Zinovev , C. E. Tripa , M. J. Pellin , Q. Peng , J. W. Elam , I. V. Veryovkin

The operational lifetime of ionic liquid electrospray propulsion systems is limited by plume-extractor electrode interactions. Over time, propellant accumulation, surface erosion, and electrical shorts degrade the extractor and therefore…

应用物理 · 物理学 2026-01-06 Giuliana Caramella Hofheins , Aleksandra B. Biedron , Elaine M Petro

The continuous technological development of electronic devices and the introduction of new materials leads to ever greater demands on the fabrication of semiconductor heterostructures and their characterization. This work focuses on…

Orientation and three-dimensional structure of immobilized proteins on bio-devices are very important to assure their high performance. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is able to analyze upper surface of one layer…

生物物理 · 物理学 2010-01-18 Satoka Aoyagi , Alain Rouleau , Wilfrid Boireau

Desulfovibrio alaskensis G20 (DA-G20) is utilized as a model for sulfate-reducing bacteria (SRB) that are associated with corrosion issues caused by microorganisms. SRB-based biofilms are thought to be responsible for the…

计算机视觉与模式识别 · 计算机科学 2023-07-25 Md Hafizur Rahman , Md Ali Azam , Md Abir Hossen , Shankarachary Ragi , Venkataramana Gadhamshetty

Biological tissue imaging by secondary ion mass spectrometry has seen rapid development with the commercial availability of polyatomic primary ion sources. Endogenous lipids and other small bio-molecules can now be routinely mapped on the…

Using low energy Time-of-Flight Scattering and Recoil Spectroscopy (TOF-SARS) and Mass Spectroscopy of Recoiled Ions (MSRI) we analyze the surface structure of an atomically smooth BaBiO$_3$ film grown by molecular beam epitaxy. We…

其他凝聚态物理 · 物理学 2009-11-13 A. Gozar , G. Logvenov , V. Y. Butko , I. Bozovic

The current study explores an artificial intelligence framework for measuring the structural features from microscopy images of the bacterial biofilms. Desulfovibrio alaskensis G20 (DA-G20) grown on mild steel surfaces is used as a model…

Time of flight backscattering spectrometry (ToF-BS) was successfully implemented in a helium ion microscope (HIM). Its integration introduces the ability to perform laterally resolved elemental analysis as well as elemental depth profiling…

仪器与探测器 · 物理学 2015-12-21 Nico Klingner , René Heller , Gregor Hlawacek , Johannes von Borany , John Notte , Jason Huang , Stefan Facsko

The presence of bacterial biofilms in clinical and industrial settings is a major issue worldwide. A biofilm is a viscoelastic matrix, composed of bacteria producing a network of Extracellular Polymeric Substances (EPS) to which bacteria…

Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…

材料科学 · 物理学 2022-10-18 Lex Pillatsch , Szilvia Kalácska , Xavier Maeder , Johann Michler

Plasma profiling time of flight mass spectrometry (PP-TOFMS) has recently gained interest, as it enables the elemental profiling of semiconductor structures with high depth resolution in short acquisition times. As recently shown by Tempez…

Plan-view transmission electron microscopy (TEM) samples are key to understand the atomic structure and associated properties of materials along their growth orientation, especially for thin films that are stain-engineered onto different…

应用物理 · 物理学 2024-01-08 Supriya Ghosh , Fengdeng Liu , Sreejith Nair , Bharat Jalan , K. Andre Mkhoyan

In this communication, we report results of a high resolution sputter depth profiling analysis of a stack of 16 alternating MgO and ZnO nanolayers grown by atomic layer deposition (ALD) with thickness of ~5.5 nm per layer. We used an…

材料科学 · 物理学 2014-03-21 S. V. Baryshev , J. A. Klug , A. V. Zinovev , C. E. Tripa , J. W. Elam , I. V. Veryovkin

This paper introduces a novel deconvolution algorithm, shift-invariant multi-linearity (SIML), which significantly enhances the analysis of data from a comprehensive two-dimensional gas chromatograph coupled to a mass spectrometric detector…

信号处理 · 电气工程与系统科学 2024-12-18 Paul-Albert Schneide , Michael Sorochan Armstrong , Neal Gallagher , Rasmus Bro

Superconducting qubits have emerged as a potentially foundational platform technology for addressing complex computational problems deemed intractable with classical computing. Despite recent advances enabling multiqubit designs that…

Biofilms are spatially organized microorganism colonies embedded in a self-produced matrix, conferring to the microbial community resistance to environmental stresses. Motile bacteria have been observed swimming in the matrix of pathogenic…

定量方法 · 定量生物学 2022-05-24 Guillaume Ravel , Michel Bergmann , Alain Trubuil , Julien Deschamps , Romain Briandet , Simon Labarthe

Mass measurements of fission and projectile fragments, produced via $^{238}$U and $^{124}$Xe primary beams, have been performed with the multiple-reflection time-of-flight mass spectrometer (MR-TOF-MS) of the FRS Ion Catcher with a mass…

Structured illumination microscopy (SIM) has attained high spatiotemporal delineation of subcellular architecture, yet offers limited insight into chemical composition. We develop Chem-SIM, a structured-illumination fluorescence detected…

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