相关论文: Evaluating Vulnerability of Chiplet-Based Systems …

Modern hardware designs have grown increasingly efficient and complex. However, they are often susceptible to Common Weakness Enumerations (CWEs). This paper is focused on the formal verification of CWEs in a dataset of hardware designs…

Data collection and processing in advanced health monitoring systems are experiencing revolutionary change. In-Sensor Computing (ISC) systems emerge as a promising alternative to save energy on massive data transmission, analog-to-digital…

The increasing complexity and the short life cycles of embedded systems are pushing the current system-on-chip designs towards a rapid increasing on the number of programmable processing units, while decreasing the gate count for custom…

Reliability has been a major concern in embedded systems. Higher transistor density and lower voltage supply increase the vulnerability of embedded systems to soft errors. A Single Event Upset (SEU), which is also called a soft error, can…

As Deep Learning (DL) is continuously adopted in many safety critical applications, its quality and reliability start to raise concerns. Similar to the traditional software development process, testing the DL software to uncover its defects…

Due to reduced manufacturing yields, traditional monolithic chips cannot keep up with the compute, memory, and communication demands of data-intensive applications, such as rapidly growing deep neural network (DNN) models. Chiplet-based…

Although fabrication capabilities of Silicon Dangling Bonds have rapidly advanced from manual labor-driven laboratory work to automated manufacturing in just recent years, sub-nanometer substrate defects still pose a hindrance to production…

Differential interferometry (DI) with two coupled sensors is a most powerful approach for precision measurements in presence of strong phase noise. However DI has been studied and implemented only with classical resources. Here we…

In order to take full advantage of the U.S. Department of Energy's billion-dollar investments into the next-generation research infrastructure (e.g., exascale, light sources, colliders), advances are required not only in detector technology…

To reduce the cost of ICs and to meet the market's demand, a considerable portion of manufacturing supply chain, including silicon fabrication, packaging and testing may be pushed offshore. Utilizing a global IC manufacturing supply chain,…

Due to its sound theoretical basis and practical efficiency, masking has become the most prominent countermeasure to protect cryptographic implementations against physical side-channel attacks (SCAs). The core idea of masking is to randomly…

With increasingly sophisticated cyber-adversaries able to access a wider repertoire of mechanisms to implant malware such as ransomware, CPU/GPU keyloggers, and stealthy kernel rootkits, there is an urgent need for techniques to detect and…

With the rise in the wholesale adoption of Deep Learning (DL) models in nearly all aspects of society, a unique set of challenges is imposed. Primarily centered around the architectures of these models, these risks pose a significant…

0.2 um fully-depleted SOI technology has been developed a for X-ray pixel detectors. To improve the detector performance, some advanced process technologies are developing continuously. To utilize the high resistivity FZ-SOI, slow ramp up…

Cyber-physical systems can be subject to sensor attacks, e.g., sensor spoofing, leading to unsafe behaviors. This paper addresses this problem in the context of linear systems when an omniscient attacker can spoof several system sensors at…

Topologically protected defects have been observed and studied in a wide range of fields, such as cosmology, spin systems, cold atoms and optics as they are quenched across a phase transition into an ordered state. Revealing their origin…

- Paper withdrawn by the author - CMOS Monolithic Active Pixel Sensors for charged particle tracking are considered as technology for numerous experiments in heavy ion and particle physics. To match the requirements for those applications…

During the semiconductor manufacturing process, predicting the yield of the semiconductor is an important problem. Early detection of defective product production in the manufacturing process can save huge production cost. The data…

With the advent of 3D printers in different price ranges and sizes, they are no longer just for professionals. However, it is still challenging to use a 3D printer perfectly. Especially, in the case of the Fused Deposition Method, it is…

Memory vulnerabilities are a major threat to many computing systems. To effectively thwart spatial and temporal memory vulnerabilities, full logical memory safety is required. However, current mitigation techniques for memory safety are…